Electrical properties and surface morphology of heteroepitaxial-grown tin-doped indium oxide thin films deposited by molecular-beam epitaxy

2000 ◽  
Vol 18 (4) ◽  
pp. 1663-1667 ◽  
Author(s):  
Naoaki Taga ◽  
Yuzo Shigesato ◽  
Masayuki Kamei
2012 ◽  
Vol 38 ◽  
pp. S613-S616 ◽  
Author(s):  
Y. Seki ◽  
Y. Sawada ◽  
M.H. Wang ◽  
H. Lei ◽  
Y. Hoshi ◽  
...  

1997 ◽  
Vol 82 (2) ◽  
pp. 865-870 ◽  
Author(s):  
Radhouane Bel Hadj Tahar ◽  
Takayuki Ban ◽  
Yutaka Ohya ◽  
Yasutaka Takahashi

1997 ◽  
Vol 12 (7) ◽  
pp. 1844-1849 ◽  
Author(s):  
Y. Gao ◽  
G. Bai ◽  
Y. Liang ◽  
G. C. Dunham ◽  
S. A. Chambers

Metallic RuO2(110) thin films were grown by oxygen-plasma-assisted molecular beam epitaxy (MBE) on MgO(100) and (110) at 425 °C. RuO2 films on MgO(100) are epitaxial with two variants, while RuO2 films on MgO(110) are highly oriented with the (110) face parallel to the substrate surface. The two variants in the RuO2(110) epitaxial films resulted in a twofold mosaic microstructure. The RuO2(110) epitaxial films are very smooth and exhibit a low resistivity of ∼ 36 μΩ-cm. In contrast, the RuO2(110) textured films are very rough, and consist of small grains with a poor in-plane alignment. A slight higher resistivity (49 μΩ-cm) was found for the RuO2 (110) textured films grown on MgO(110).


2018 ◽  
Vol 52 (12) ◽  
pp. 1638-1641
Author(s):  
A. S. Ilin ◽  
A. N. Matsukatova ◽  
P. A. Forsh ◽  
Yu. Vygranenko

1993 ◽  
Vol 33 (3-4) ◽  
pp. 204-207 ◽  
Author(s):  
S. Mirzapour ◽  
S.M. Rozati ◽  
M.G. Takwale ◽  
B.R. Marathe ◽  
V.G. Bhide

Sign in / Sign up

Export Citation Format

Share Document