Comparative evaluation of chemically amplified resists for electron-beeam top surface imaging use

Author(s):  
M. Irmscher
2002 ◽  
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Dirk Beyer ◽  
Joerg Butschke ◽  
Chris Constantine ◽  
Thomas Hoffmann ◽  
...  

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Vol 11 (4) ◽  
pp. 613-618
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Shigeyasu Mori ◽  
Nobuyuki Matsuzawa ◽  
Yuko Kaimoto ◽  
Masayuki Endo ◽  
Takahiro Matsuo ◽  
...  

1999 ◽  
Author(s):  
Myoung-Soo Kim ◽  
Hyoung-Gi Kim ◽  
Hyeong-Soo Kim ◽  
Ki-Ho Baik ◽  
Donald W. Johnson ◽  
...  

2020 ◽  
Vol 59 (8) ◽  
pp. 086506
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Yuta Ikari ◽  
Kazumasa Okamoto ◽  
Akihiro Konda ◽  
Takahiro Kozawa ◽  
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2014 ◽  
Vol 13 (4) ◽  
pp. 043017 ◽  
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Abhijit A. Patil ◽  
Yogendra Narayan Pandey ◽  
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Vol 45 (No. 46) ◽  
pp. L1230-L1231
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