High-temperature sapphire extrinsic Fizeau interferometer for strain measurements on silicon carbide materials
2010 ◽
Vol 645-648
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pp. 1097-1100
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Keyword(s):
2000 ◽
Vol 9
(3-6)
◽
pp. 480-482
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1990 ◽
Vol 38
(11)
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pp. 2149-2159
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Keyword(s):
2011 ◽
Vol 311-313
◽
pp. 276-282
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