Monochromatic Kirkpatrick–Baez microscope using two spherically bent crystals

Author(s):  
Jin Shen ◽  
Ning An ◽  
Weiquan Zhang ◽  
Xuewei Du ◽  
Qiuping Wang
Keyword(s):  
1994 ◽  
Vol 183 (1) ◽  
pp. 59-72 ◽  
Author(s):  
V. B. Molodkin ◽  
S. I. Olikhovskii ◽  
A. N. Kostyuk

Author(s):  
A. Baurichter ◽  
C. Biino ◽  
M. Clément ◽  
N. Doble ◽  
K. Elsener ◽  
...  

2012 ◽  
Vol 357 ◽  
pp. 012026 ◽  
Author(s):  
N F Shul'ga ◽  
V V Syshchenko ◽  
A I Tarnovsky
Keyword(s):  

2011 ◽  
Author(s):  
V. Guidi ◽  
N. Barrière ◽  
V. Bellucci ◽  
R. Camattari ◽  
I. Neri

2001 ◽  
Vol 19 (2) ◽  
pp. 285-293 ◽  
Author(s):  
T.A. PIKUZ ◽  
A. YA. FAENOV ◽  
M. FRAENKEL ◽  
A. ZIGLER ◽  
F. FLORA ◽  
...  

The shadow monochromatic backlighting (SMB) scheme, a modification of the well-known soft X-ray monochromatic backlighting scheme, is proposed. It is based on a spherical crystal as the dispersive element and extends the traditional scheme by allowing one to work with a wide range of Bragg angles and thus in a wide spectral range. The advantages of the new scheme are demonstrated experimentally and supported numerically by ray-tracing simulations. In the experiments, the X-ray backlighter source is a laser-produced plasma, created by the interaction of an ultrashort pulse, Ti:Sapphire laser (120 fs, 3–5 mJ, 1016 W/cm2 on target) or a short wavelength XeCl laser (10 ns, 1–2 J, 1013 W/cm2 on target) with various solid targets (Dy, Ni + Cr, BaF2). In both experiments, the X-ray sources are well localized spatially (∼20 μm) and are spectrally tunable in a relatively wide wavelength range (λ = 8–15 Å). High quality monochromatic (δλ/λ ∼ 10−5–10−3) images with high spatial resolution (up to ∼4 μm) over a large field of view (a few square millimeters) were obtained. Utilization of spherically bent crystals to obtain high-resolution, large field, monochromatic images in a wide range of Bragg angles (35° < Θ < 90°) is demonstrated for the first time.


1970 ◽  
Vol 14 ◽  
pp. 38-56
Author(s):  
E. M. Proctor ◽  
T. C. Furnas ◽  
W. F. Loranger

AbstractThe efficiency and effectiveness of diffracted beam x-ray monochromators used in powder diffractometry have been described in so many ways that much confusion exists regarding their true performance. Although significant improvements in signal to noise ratios are readily achievable, and they offer a solution to the sample fluorescence problem, it is not without sacrifice to total intensity or achievable resolution or both. This paper discusses and describes a series of comparisons between filtered direct beam, LiF and graphite monochromators.These comparisons include the considerations necessary for the appropriate selection of diffracted beam slit system, the effect of vertical divergence as a function of two theta for singly bent crystals, the effects of a non-uniformity of contribution over the length of the crystal, and the geometry necessary for the singly bent and doubly bent crystals. The total intensity and the resolution of LiF and graphite are discussed, in particular, it is noted that the performance of monochromators with randomly oriented samples is quite different than their performance with samples showing preferred orientation or grain effects.A new diffracted beam monochromator based on the Rowland focusing geometry is described.


2020 ◽  
Vol 804 ◽  
pp. 135396 ◽  
Author(s):  
W. Scandale ◽  
G. Arduini ◽  
F. Cerutti ◽  
M. Garattini ◽  
S. Gilardoni ◽  
...  

2014 ◽  
Vol 21 (4) ◽  
pp. 762-767 ◽  
Author(s):  
Ari-Pekka Honkanen ◽  
Roberto Verbeni ◽  
Laura Simonelli ◽  
Marco Moretti Sala ◽  
Ali Al-Zein ◽  
...  

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanenet al.(2014).J. Synchrotron Rad.21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann-type spectrometer using a spherically bent Si(660) analyser in near-backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.


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