Surface structure, nanocrystallite and defects in (ZrTi)CN nanocomposite irradiated by electron beam

2021 ◽  
pp. 2150111
Author(s):  
M. Yu. Tashmetov ◽  
I. I. Yuldashova ◽  
N. B. Ismatov
Keyword(s):  
Electron Beam ◽  
Surface Structure ◽  
Electron Beam Irradiation ◽  
Rietveld Method ◽  
Nanocomposite Coating ◽  
Beam Irradiation ◽  
X Ray ◽  
Nanocrystallite Size ◽  
Atomic Force ◽  
Cubic Structure

Effect of 2 MeV electron beam at the current density 0.09 nA/cm2 on surface structure, nanocrystallite size of (ZrTi)CN nanocomposite coating on steel was investigated at Scanning Electron and Atomic Force microscopes, and also X-ray diffractometer. Using the Rietveld method, two structure phases were indentified in the pristine samples: (ZrTi)(CN)-cubic (space group Fm-3m) and TiC — trigonal (sp.gr.R-3m). Electron beam irradiation to the fluency of [Formula: see text] electron/cm2 resulted in the phase transition of TiC from trigonal (sp.gr.R-3m) to cubic structure (sp.gr.Fm-3m). Besides, nanocrystallite size and shape have changed after the fluency [Formula: see text] electron/cm2. The lattice parameters have increased up to [Formula: see text] electron/cm2 fluence and the nanorcrystallite size of nanocomposite was enlarged 26%, which was attributed to generation of defects.

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

Concept development of X-ray mass thickness detection for irradiated items upon electron beam irradiation processing

2018 ◽  
Vol 143 ◽  
pp. 8-13
Author(s):  
Huaili Qin ◽  
Guang Yang ◽  
Shan Kuang ◽  
Qiang Wang ◽  
Jingjing Liu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Concept Development ◽  
Beam Irradiation ◽  
X Ray ◽  
Mass Thickness

Radiotherapy in the Management of Keloids Clinical Experience with Electron Beam Irradiation and Comparison with X-Ray Therapy

2002 ◽  
Vol 178 (6) ◽  
pp. 330-335 ◽  
Author(s):  
Mohammad Maarouf ◽  
Ursula Schleicher ◽  
Axel Schmachtenberg ◽  
Jürgen Ammon
Keyword(s):  
Electron Beam ◽  
Clinical Experience ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
X Ray

Comparison of the Effect of X-ray and Electron Beam Irradiation on the Microbiological Quality of Foodstuffs

LWT ◽  
1999 ◽  
Vol 32 (6) ◽  
pp. 372-376 ◽  
Author(s):  
S. Van Calenberg ◽  
O. Van Cleemput ◽  
W. Mondelaers ◽  
A. Huyghebaert
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Microbiological Quality ◽  
Beam Irradiation ◽  
X Ray

Comparison of the Effect of X-ray and Electron Beam Irradiation on Some Selected Spices

LWT ◽  
1998 ◽  
Vol 31 (3) ◽  
pp. 252-258 ◽  
Author(s):  
Sabine Van Calenberg ◽  
Gauthier Vanhaelewyn ◽  
Oswald Van Cleemput ◽  
Freddy Callens ◽  
Wim Mondelaers ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
X Ray

Curing of degraded MAPbI3perovskite films

RSC Advances ◽  
2016 ◽  
Vol 6 (65) ◽  
pp. 60620-60625 ◽  
Author(s):  
Xin Guo ◽  
Christopher McCleese ◽  
Wei-Chun Lin ◽  
Clemens Burda
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Solution Deposition ◽  
X Ray ◽  
Ambient Humidity ◽  
One Step ◽  
Over Time

Perovskite films were prepared using a one-step solution deposition. Such films degrade over time because of the ambient humidity. Curing of degraded films through X-ray, UV and electron beam irradiation is demonstrated.

Compositional change of NaCl particles under electron beam irradiation measured by time-resolved X-ray analysis

2012 ◽  
Vol 18 (S2) ◽  
pp. 1052-1053
Author(s):  
I. Ohnishi ◽  
K. Shibuya ◽  
K. Tachibana ◽  
J. Yamagata ◽  
M. Morita ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Compositional Change ◽  
Beam Irradiation ◽  
Time Resolved ◽  
X Ray

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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