Surface structure, nanocrystallite and defects in (ZrTi)CN nanocomposite irradiated by electron beam

Effect of 2 MeV electron beam at the current density 0.09 nA/cm2 on surface structure, nanocrystallite size of (ZrTi)CN nanocomposite coating on steel was investigated at Scanning Electron and Atomic Force microscopes, and also X-ray diffractometer. Using the Rietveld method, two structure phases were indentified in the pristine samples: (ZrTi)(CN)-cubic (space group Fm-3m) and TiC — trigonal (sp.gr.R-3m). Electron beam irradiation to the fluency of [Formula: see text] electron/cm2 resulted in the phase transition of TiC from trigonal (sp.gr.R-3m) to cubic structure (sp.gr.Fm-3m). Besides, nanocrystallite size and shape have changed after the fluency [Formula: see text] electron/cm2. The lattice parameters have increased up to [Formula: see text] electron/cm2 fluence and the nanorcrystallite size of nanocomposite was enlarged 26%, which was attributed to generation of defects.

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A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

ISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2013p0228 ◽

2013 ◽

Author(s):

Wei-Chih Wang ◽

Jian-Shing Luo

Keyword(s):

Electron Beam ◽

Electron Beam Irradiation ◽

Forward Bias ◽

Irradiation Damage ◽

Beam Irradiation ◽

Excess Current ◽

Atomic Force ◽

Order Of Magnitude ◽

Voltage Contrast ◽

Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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Concept development of X-ray mass thickness detection for irradiated items upon electron beam irradiation processing

Radiation Physics and Chemistry ◽

10.1016/j.radphyschem.2017.09.012 ◽

2018 ◽

Vol 143 ◽

pp. 8-13

Author(s):

Huaili Qin ◽

Guang Yang ◽

Shan Kuang ◽

Qiang Wang ◽

Jingjing Liu ◽

...

Keyword(s):

Electron Beam ◽

Electron Beam Irradiation ◽

Concept Development ◽

Beam Irradiation ◽

X Ray ◽

Mass Thickness

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Radiotherapy in the Management of Keloids Clinical Experience with Electron Beam Irradiation and Comparison with X-Ray Therapy

Strahlentherapie und Onkologie ◽

10.1007/s00066-002-0935-6 ◽

2002 ◽

Vol 178 (6) ◽

pp. 330-335 ◽

Cited By ~ 35

Author(s):

Mohammad Maarouf ◽

Ursula Schleicher ◽

Axel Schmachtenberg ◽

Jürgen Ammon

Keyword(s):

Electron Beam ◽

Clinical Experience ◽

Electron Beam Irradiation ◽

Beam Irradiation ◽

X Ray

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Comparison of the Effect of X-ray and Electron Beam Irradiation on the Microbiological Quality of Foodstuffs

LWT ◽

10.1006/fstl.1999.0568 ◽

1999 ◽

Vol 32 (6) ◽

pp. 372-376 ◽

Cited By ~ 11

Author(s):

S. Van Calenberg ◽

O. Van Cleemput ◽

W. Mondelaers ◽

A. Huyghebaert

Keyword(s):

Electron Beam ◽

Electron Beam Irradiation ◽

Microbiological Quality ◽

Beam Irradiation ◽

X Ray

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Comparison of the Effect of X-ray and Electron Beam Irradiation on Some Selected Spices

LWT ◽

10.1006/fstl.1997.0352 ◽

1998 ◽

Vol 31 (3) ◽

pp. 252-258 ◽

Cited By ~ 29

Author(s):

Sabine Van Calenberg ◽

Gauthier Vanhaelewyn ◽

Oswald Van Cleemput ◽

Freddy Callens ◽

Wim Mondelaers ◽

...

Keyword(s):

Electron Beam ◽

Electron Beam Irradiation ◽

Beam Irradiation ◽

X Ray

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Simulation calculation on electronic processes under intense X-ray and electron beam irradiation

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/0168-9002(93)91402-9 ◽

1993 ◽

Vol 327 (1) ◽

pp. 31-33 ◽

Cited By ~ 1

Author(s):

Tsutomu Watanabe ◽

Naoko Yamamoto ◽

Xiao-min Tong

Keyword(s):

Electron Beam ◽

Electron Beam Irradiation ◽

Beam Irradiation ◽

X Ray ◽

Simulation Calculation

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Resist Hardening by Electron Beam Irradiation Analyzed by Atomic Force Microscope.

Journal of Photopolymer Science and Technology ◽

10.2494/photopolymer.14.751 ◽

2001 ◽

Vol 14 (5) ◽

pp. 751-752 ◽

Cited By ~ 1

Author(s):

Akira Kawai ◽

Norio Moriike

Keyword(s):

Electron Beam ◽

Atomic Force Microscope ◽

Electron Beam Irradiation ◽

Beam Irradiation ◽

Atomic Force

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Curing of degraded MAPbI3perovskite films

RSC Advances ◽

10.1039/c6ra09714f ◽

2016 ◽

Vol 6 (65) ◽

pp. 60620-60625 ◽

Cited By ~ 11

Author(s):

Xin Guo ◽

Christopher McCleese ◽

Wei-Chun Lin ◽

Clemens Burda

Keyword(s):

Electron Beam ◽

Electron Beam Irradiation ◽

Beam Irradiation ◽

Solution Deposition ◽

X Ray ◽

Ambient Humidity ◽

One Step ◽

Over Time

Perovskite films were prepared using a one-step solution deposition. Such films degrade over time because of the ambient humidity. Curing of degraded films through X-ray, UV and electron beam irradiation is demonstrated.

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