Hot-Carrier-Induced Degradation under Current Saturation Bias in p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors

2007 ◽  
Vol 46 (8A) ◽  
pp. 5044-5049 ◽  
Author(s):  
Masahiro Yamagata ◽  
Toshifumi Satoh ◽  
Hiroyuki Tango
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Current Saturation

Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

2003 ◽  
Vol 42 (Part 1, No. 4B) ◽  
pp. 1999-2003 ◽  
Author(s):  
Toshiyuki Yoshida ◽  
Yoshiki Ebiko ◽  
Michiko Takei ◽  
Nobuo Sasaki ◽  
Toshiaki Tsuchiya
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Grain Boundary ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide

2007 ◽  
Vol 46 (7A) ◽  
pp. 4021-4027 ◽  
Author(s):  
Hitoshi Ueno ◽  
Yuta Sugawara ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama ◽  
Yukiharu Uraoka ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Gate Oxide ◽  
Silicon Thin Film
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