Hot-Carrier Degradation in Low-Temperature Polycrystalline Silicon n-Channel Lightly Doped Drain Thin-Film Transistors

2009 ◽  
Vol 48 (1) ◽  
pp. 011207 ◽  
Author(s):  
Seishiro Hirata ◽  
Masahiro Yamagata ◽  
Toshifumi Satoh ◽  
Hiroyuki Tango
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Hot Carrier ◽  
Lightly Doped Drain ◽  
Hot Carrier Degradation

Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

2003 ◽  
Vol 42 (Part 1, No. 4B) ◽  
pp. 1999-2003 ◽  
Author(s):  
Toshiyuki Yoshida ◽  
Yoshiki Ebiko ◽  
Michiko Takei ◽  
Nobuo Sasaki ◽  
Toshiaki Tsuchiya
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Grain Boundary ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Analysis of Hot Carrier Effect in Low-Temperature Poly-Si Gate-Overlapped Lightly Doped Drain Thin Film Transistors

2003 ◽  
Vol 42 (Part 1, No. 6A) ◽  
pp. 3354-3360 ◽  
Author(s):  
Tetsuo Kawakita ◽  
Hidehiro Nakagawa ◽  
Yukiharu Uraoka ◽  
Takashi Fuyuki
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Hot Carrier ◽  
Carrier Effect ◽  
Hot Carrier Effect ◽  
Lightly Doped Drain
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