Active workflow system for near real-time extreme-scale science

Author(s):  
Yanwei Zhang ◽  
Qing Liu ◽  
Scott Klasky ◽  
Matthew Wolf ◽  
Karsten Schwan ◽  
...  
Author(s):  
Bhaskar Botcha ◽  
Zimo Wang ◽  
Sudarshan Rajan ◽  
Natarajan Gautam ◽  
Satish T. S. Bukkapatnam ◽  
...  

Prior R&D efforts point to substantial performance enhancements and energy savings from adopting the Smart Manufacturing (SM) paradigm for process optimization and real-time quality assurance. Significant barriers and risks disincentivize the industry from investing in the adoption and training of SM component suites for discrete manufacturing applications. A diverse discrete part manufacturing enterprises, SM tools and platform vendors are yearning for a testbed reconfigurable to achieve three objectives of performance benchmarking, demonstration, and workforce training for a spectrum of their industrial scenarios and workflows. This paper presents the key ingredients towards the successful transformation of present machine tool and manufacturing environments into SM platform-integrated environments. The present implementation focuses on demonstration of the use of the Smart Manufacturing (SM) platform towards qualification of advanced materials and manufacturing technologies to meet an industry-specified functionality. This initial implementation uses Kepler workflow system residing as part of an Amazon Web Services environment to allow flexible workflows on multiple machines, each of which is integrated with an innovative sensor wrapper that integrates Commercial Off The Shelf (COTS) components from National Instruments (NI) to connect a legacy equipment to the SM platform. Here, an advanced analytics engine with modules customizable for both high-performance computing and shop floor environments was integrated into the commercial web service (from Amazon) to provide real-time monitoring and anomaly detection capability. This implementation indicates the potential of SM platform to achieve drastic reductions in the time and effort taken towards qualification of advanced materials and manufacturing technologies.


Author(s):  
Isabel Schwerdtfeger

This chapter discusses the challenges high-end storage solutions will have with future demands. Due to heavy end-user demands for real-time processing of data access, this need must be addressed by high-end storage solutions. But what type of high-end storage solutions address this need and are suitable to ensure high performance write and retrieval of data in real-time from high- end storage infrastructures, including read and write access from digital archives? For this reason, this chapter reviews a few disk and tape solutions as well as combined disk- and tape storage solutions. The review on the different storage solutions does not focus on compliance of data storage management, but on available commercial high-end systems, addressing scalability and performance requirements both for online storage and archives. High level requirements aid in identifying high-end storage system features and support Extreme Scale infrastructures for the amount of data that high-end storage systems will need to manage in future.


2018 ◽  
Vol 173 ◽  
pp. 05012
Author(s):  
Minh Duc Nguyen

This paper provides a case study on satellite data processing, storage, and distribution in the space weather domain by introducing the Satellite Data Downloading System (SDDS). The approach proposed in this paper was evaluated through real-world scenarios and addresses the challenges related to the specific field. Although SDDS is used for satellite data processing, it can potentially be adapted to a wide range of data processing scenarios in other fields of physics.


1979 ◽  
Vol 44 ◽  
pp. 41-47
Author(s):  
Donald A. Landman

This paper describes some recent results of our quiescent prominence spectrometry program at the Mees Solar Observatory on Haleakala. The observations were made with the 25 cm coronagraph/coudé spectrograph system using a silicon vidicon detector. This detector consists of 500 contiguous channels covering approximately 6 or 80 Å, depending on the grating used. The instrument is interfaced to the Observatory’s PDP 11/45 computer system, and has the important advantages of wide spectral response, linearity and signal-averaging with real-time display. Its principal drawback is the relatively small target size. For the present work, the aperture was about 3″ × 5″. Absolute intensity calibrations were made by measuring quiet regions near sun center.


Author(s):  
Alan S. Rudolph ◽  
Ronald R. Price

We have employed cryoelectron microscopy to visualize events that occur during the freeze-drying of artificial membranes by employing real time video capture techniques. Artificial membranes or liposomes which are spherical structures within internal aqueous space are stabilized by water which provides the driving force for spontaneous self-assembly of these structures. Previous assays of damage to these structures which are induced by freeze drying reveal that the two principal deleterious events that occur are 1) fusion of liposomes and 2) leakage of contents trapped within the liposome [1]. In the past the only way to access these events was to examine the liposomes following the dehydration event. This technique allows the event to be monitored in real time as the liposomes destabilize and as water is sublimed at cryo temperatures in the vacuum of the microscope. The method by which liposomes are compromised by freeze-drying are largely unknown. This technique has shown that cryo-protectants such as glycerol and carbohydrates are able to maintain liposomal structure throughout the drying process.


Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.


Author(s):  
R. Rajesh ◽  
R. Droopad ◽  
C. H. Kuo ◽  
R. W. Carpenter ◽  
G. N. Maracas

Knowledge of material pseudodielectric functions at MBE growth temperatures is essential for achieving in-situ, real time growth control. This allows us to accurately monitor and control thicknesses of the layers during growth. Undesired effusion cell temperature fluctuations during growth can thus be compensated for in real-time by spectroscopic ellipsometry. The accuracy in determining pseudodielectric functions is increased if one does not require applying a structure model to correct for the presence of an unknown surface layer such as a native oxide. Performing these measurements in an MBE reactor on as-grown material gives us this advantage. Thus, a simple three phase model (vacuum/thin film/substrate) can be used to obtain thin film data without uncertainties arising from a surface oxide layer of unknown composition and temperature dependence.In this study, we obtain the pseudodielectric functions of MBE-grown AlAs from growth temperature (650°C) to room temperature (30°C). The profile of the wavelength-dependent function from the ellipsometry data indicated a rough surface after growth of 0.5 μm of AlAs at a substrate temperature of 600°C, which is typical for MBE-growth of GaAs.


Author(s):  
K. Harada ◽  
T. Matsuda ◽  
J.E. Bonevich ◽  
M. Igarashi ◽  
S. Kondo ◽  
...  

Previous observations of magnetic flux-lines (vortex lattices) in superconductors, such as the field distribution of a flux-line, and flux-line dynamics activated by heat and current, have employed the high spatial resolution and magnetic sensitivity of electron holography. And recently, the 2-D static distribution of vortices was also observed by this technique. However, real-time observations of the vortex lattice, in spite of scientific and technological interest, have not been possible due to experimental difficulties. Here, we report the real-time observation of vortex lattices in a thin superconductor, by means of Lorentz microscopy using a 300 kV field emission electron microscope. This technique allows us to observe the dynamic motion of individual vortices and record the events on a VTR system.The experimental arrangement is shown in Fig. 1. A Nb thin film for transmission observation was prepared by chemical etching. The grain size of the film was increased by annealing, and single crystals were observed with a thickness of 50∼90 nm.


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