Dielectric Spectroscopy Analyses of SrBi4Ti4O15Films Obtained from Soft Chemical Solution
2009 ◽
Vol 2009
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pp. 1-6
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Keyword(s):
X Ray
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SrBi4Ti4O15(SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 μC/cm2and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film.
Keyword(s):