Multi-Functional Cr–Al–Ti–Si–N Nanocomposite Films Deposited on WC-Co Substrate for Cutting Tools

2020 ◽  
Vol 20 (7) ◽  
pp. 4390-4393 ◽  
Author(s):  
Wang Ryeol Kim ◽  
Sungbo Heo ◽  
Jun-Ho Kim ◽  
In-Wook Park ◽  
Wonsub Chung

Multi-functional quinary Cr–Al–Ti–Si–N thin films were deposited onto WC-Co substrates using a cathodic arc evaporation system. In this study, the influence of silicon contents on the microstructure, mechanical, tribological, and oxidation properties of Cr–Al–Ti–Si–N thin films were systematically investigated and correlated for application of cutting tools. Based on results from various analyses, the Cr–Al–Ti–Si–N films showed excellent properties including mechanical, tribological, oxidation and adhesion values compared with those of the Cr–Al–Ti–N film. The Cr–Al–Ti–Si–N films with a Si content of around 4.21 at.% exhibited the highest hardness of 45 GPa, very low friction coefficient of 0.38 at room temperature against an Inconel alloy ball and superior adhesion property (105 N). The Cr–Al–Ti–Si–N films also showed excellent oxidation resistance after annealing in the ambient air at 1000 °C. Therefore, the Cr–Al–Ti–Si(4.21 at.%)–N films could be help to improve the performance of machining and cutting tools with application of the films.

1997 ◽  
Vol 90 (1-2) ◽  
pp. 178-183 ◽  
Author(s):  
F. Richter ◽  
G. Krannich ◽  
J. Hahn ◽  
R. Pintaske ◽  
M. Friedrich ◽  
...  

2010 ◽  
Vol 519 (4) ◽  
pp. 1397-1403 ◽  
Author(s):  
L.J.S. Johnson ◽  
L. Rogström ◽  
M.P. Johansson ◽  
M. Odén ◽  
L. Hultman

2013 ◽  
Vol 235 ◽  
pp. 376-382 ◽  
Author(s):  
H. Fager ◽  
J.M. Andersson ◽  
J. Lu ◽  
M.P. Johansson Jöesaar ◽  
M. Odén ◽  
...  

2021 ◽  
Vol 62 (1) ◽  
pp. 41-50
Author(s):  
Vukoman Jokanović ◽  
Nenad Bundaleski ◽  
Božana Čolović ◽  
Manuela Ferarra ◽  
Bojan Jokanović ◽  
...  

Physicochemical properties of thin films on the base of titanium oxides, obtained by a cathodic arc evaporation on the surface of glass substrate are analysed in details. The analysis of these films was made by using XRD, FTIR, SEM, XPS analysis and ellipsometry. On the basis of these analyses, particularly analysis obtained by XPS, the oxidative state Ti and corresponding phases are determined through various film layers from the surface to the substrate. The depth of the various levels and their extinction coefficients and refractory indexes are estimated by ellipsometry.


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