New Directions In Very High Resolution Analytical Electron Microscopy

2022 ◽  
pp. 269-272
Author(s):  
P Kruit
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
New Directions ◽  
Analytical Electron ◽  
Very High

scholarly journals Analytical High-resolution Electron Microscopy Reveals Organ-specific Nanoceria Bioprocessing

2017 ◽  
Vol 46 (1) ◽  
pp. 47-61 ◽  
Author(s):  
Uschi M. Graham ◽  
Robert A. Yokel ◽  
Alan K. Dozier ◽  
Lawrence Drummy ◽  
Krishnamurthy Mahalingam ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
High Resolution Electron Microscopy ◽  
Dark Field ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Organ Specific

This is the first utilization of advanced analytical electron microscopy methods, including high-resolution transmission electron microscopy, high-angle annular dark field scanning transmission electron microscopy, electron energy loss spectroscopy, and energy-dispersive X-ray spectroscopy mapping to characterize the organ-specific bioprocessing of a relatively inert nanomaterial (nanoceria). Liver and spleen samples from rats given a single intravenous infusion of nanoceria were obtained after prolonged (90 days) in vivo exposure. These advanced analytical electron microscopy methods were applied to elucidate the organ-specific cellular and subcellular fate of nanoceria after its uptake. Nanoceria is bioprocessed differently in the spleen than in the liver.

High-resolution analytical electron microscopy of catalytically etched silicon nanowires

2009 ◽  
Vol 95 (2) ◽  
pp. 325-327 ◽  
Author(s):  
M. Schade ◽  
N. Geyer ◽  
B. Fuhrmann ◽  
F. Heyroth ◽  
H. S. Leipner
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Silicon Nanowires ◽  
Analytical Electron Microscopy ◽  
Analytical Electron ◽  
Etched Silicon

New precipitate morphology in heat treated CZ Si wafers

1983 ◽  
Vol 41 ◽  
pp. 152-153
Author(s):  
H.L. TSAI ◽  
R.W. CARPENTER
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
Interstitial Oxygen ◽  
Precipitate Morphology ◽  
Silicon Ingot ◽  
Heat Treated ◽  
Initial Carbon ◽  
Analytical Electron ◽  
Plate Type

The morphological forms of the precipitates and other defects in the heat-treated oxygen-containing CZ silicon have been extensively documented, but little information concerning the morphology as a function of the position in the ingot has been reported. Recent studies, using high resolution analytical electron microscopy, have shown that plate type precipitates observed in the seed end of the silicon ingot were amorphous and contain oxygen. We have carried out a detailed TEM study of the precipitate morphology in the heat-treated wafers cut from the seed, middle, and tang regions of the CZ ingot. The interstitial oxygen concentrations in the as grown Si were 2.1×1018cm−3, 1.6×10−18cm−3, and 1.5×1018cm−3 in the seed, middle and tang regions, respectively. Initial carbon was below IR detectability limit, but was higher in the tail than seed, based on segregation coefficients. The wafers were subjected to two-step anneals: 1. 0-16 hrs., 800°C in nitrogen and 2. 16 hrs., 1050°C in dry oxygen.

High-resolution analytical electron microscopy (HRAEM) study of LaCo5 intermetallic catalysts

1986 ◽  
Vol 44 ◽  
pp. 768-769
Author(s):  
Z. L. Wang ◽  
C. Colliex ◽  
V. Paul-Boncour ◽  
A. Percheron-Guegan
Keyword(s):  
Electron Microscopy ◽  
Data Analysis ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Analytical Electron Microscopy ◽  
Radiation Absorption ◽  
Microscopic Structure ◽  
Analytical Electron ◽  
Metal Support ◽  
Absorption Measurements

Intermetal1ic compounds, such as LaCo5, have been used as active and selective catalysts in chemical reaction involving (CO,H2) mixtures. The general understanding regarding these catalysts is that the observed activation is associated with a partial transformation of the intermetallic component into a metal-support system. The macroscopic study of LaCo3 by use of synchrotron radiation absorption measurements (EXAFS and XANES data analysis) largely support this hypothesis. In this work, the microscopic structure of these catalysts has been studied by HRAEM.

scholarly journals High-Resolution Analytical Electron Microscopy Reveals Cell Culture Media-Induced Changes to the Chemistry of Silver Nanowires

2013 ◽  
Vol 47 (23) ◽  
pp. 13813-13821 ◽  
Author(s):  
Shu Chen ◽  
Ioannis G. Theodorou ◽  
Angela E. Goode ◽  
Andrew Gow ◽  
Stephan Schwander ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Cell Culture ◽  
High Resolution ◽  
Culture Media ◽  
Silver Nanowires ◽  
Analytical Electron Microscopy ◽  
Cell Culture Media ◽  
Analytical Electron ◽  
Induced Changes

The Raft-Like Structure of Supported PtRu5

1997 ◽  
Vol 497 ◽  
Author(s):  
J. C. Yang ◽  
S. Bradley ◽  
M. N. Nashner ◽  
R. Nuzzo ◽  
J. M. Gibson
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Carbon Black ◽  
Analytical Electron Microscopy ◽  
Average Diameter ◽  
Atomic Concentration ◽  
Analytical Electron ◽  
Microscopy Techniques

ABSTRACTWe have examined supported PtRus specimens by a variety of electron microscopy techniques, including high resolution, analytical and a novel mass-spectroscopic electron microscopy techniques. Analytical electron microscopy results showed that the relative atomic concentration of Pt to Ru for each PtRu5 cluster is 1 to 5. The average diameter of the clusters was a 15.6Å, and the average number of atoms was measured to be 24 atoms per cluster. The combination of these techniques demonstrate that the PtRu5 clusters are raft-like on the carbon black support.

High Resolution, High Voltage and Analytical Electron Microscopy

JOM ◽  
1985 ◽  
Vol 37 (2) ◽  
pp. 36-41 ◽  
Author(s):  
R. Gronsky ◽  
G. Thomas ◽  
K. H. Westmacott
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Voltage ◽  
Analytical Electron Microscopy ◽  
Analytical Electron
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