Determination of size, shape and composition of buried InAs/GaAs quantum dots: scanning transmission electron microscopy vs. in-plane X-ray scattering

2018 ◽  
pp. 91-94
Author(s):  
D Zhi ◽  
P F Fewster ◽  
D W Pashley ◽  
B A Joyce ◽  
P J Goodhew ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Quantum Dots ◽  
Scanning Transmission Electron Microscopy ◽  
X Ray ◽  
Scanning Transmission Electron ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Scanning Transmission

Determination of Nanocluster Sizes from Dark-Field Scanning Transmission Electron Microscopy Images

2008 ◽  
Vol 112 (6) ◽  
pp. 1759-1763 ◽  
Author(s):  
Norihiko L. Okamoto ◽  
Bryan W. Reed ◽  
Shareghe Mehraeen ◽  
Apoorva Kulkarni ◽  
David Gene Morgan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Microscopy Images
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