Modelling of maintenance and inspection policies for marine systems using Monte Carlo simulation and Delay-Time Analysis

2015 ◽  
pp. 1845-1852
Author(s):  
D McNamara ◽  
A Cunningham ◽  
R Riahi ◽  
I Jenkinson ◽  
J Wang
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Delay Time ◽  
Time Analysis ◽  
Marine Systems ◽  
Maintenance And Inspection

scholarly journals Application of Monte Carlo techniques with delay-time analysis to assess maintenance and inspection policies for marine systems

2016 ◽  
Vol 231 (2) ◽  
pp. 89-106 ◽  
Author(s):  
D McNamara ◽  
A Cunningham ◽  
R Riahi ◽  
I Jenkinson ◽  
J Wang
Keyword(s):  
Monte Carlo ◽  
Delay Time ◽  
Monte Carlo Model ◽  
Spare Part ◽  
Time Analysis ◽  
Factors Affecting ◽  
Monte Carlo Techniques ◽  
Marine System ◽  
Maintenance And Inspection ◽  
The Impact

This paper presents a novel methodology applying Monte Carlo methods with delay-time analysis to test the effects of scheduled maintenance and inspection actions on factors affecting the operational efficiency of a marine system which is subject to degradation. The aim is to demonstrate how a Monte Carlo model incorporated into delay-time analysis can be used to predict the transition behaviour of a system under analysis. The model presented in this paper focuses on the effects on system failure probability and downtime of various maintenance and inspection policies. The impact on spare part requirements is also investigated.

scholarly journals Application of delay-time analysis via Monte Carlo simulation

2011 ◽  
Vol 10 (3) ◽  
pp. 57-72 ◽  
Author(s):  
A Cunningham ◽  
W Wang ◽  
E Zio ◽  
A Wall ◽  
D Allanson ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Delay Time ◽  
Time Analysis

Temporal dispersion of the emergence of intelligence: an inter-arrival time analysis

2011 ◽  
Vol 10 (2) ◽  
pp. 131-135 ◽  
Author(s):  
Thomas W. Hair
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Arrival Time ◽  
Time Analysis ◽  
Arrival Times ◽  
The Galaxy ◽  
Sphere Of Influence ◽  
The Impact ◽  
Temporal Dispersion

AbstractMany reasons for why extraterrestrial intelligences might avoid communications with our civilization have been proposed. One possible scenario is that all civilizations follow the lead of some particularly distinguished civilization. This paper will examine the impact the first successful civilization could have on all other subsequent civilizations within its sphere of influence and the ramifications of this as it relates to the Fermi Paradox. Monte Carlo simulation is used to map the inter-arrival times of early civilizations and to highlight the immense epochs of time that the earliest civilizations could have had the Galaxy to themselves.

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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