scholarly journals DC, RF, and Thermal Characterization of High Electric Field Induced Degradation Mechanisms in GaN-on-Si High Electron Mobility Transistors

2013 ◽  
Author(s):  
Matthew Anthony Bloom
Keyword(s):  
Electric Field ◽  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
Thermal Characterization ◽  
High Electron ◽  
Degradation Mechanisms ◽  
High Electron Mobility ◽  
Electron Mobility Transistors ◽  
Gan On Si

scholarly journals Electric Field Reduction in C-Doped AlGaN/GaN on Si High Electron Mobility Transistors

2015 ◽  
Vol 36 (8) ◽  
pp. 826-828 ◽  
Author(s):  
Michael J. Uren ◽  
Markus Caesar ◽  
Serge Karboyan ◽  
Peter Moens ◽  
Piet Vanmeerbeek ◽  
...  
Keyword(s):  
Electric Field ◽  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Electron Mobility Transistors ◽  
Gan On Si
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