scholarly journals Retrieval of the aerosol microstructure from light extinction data measured in a limited spectral range

2015 ◽  
Vol 28 (10) ◽  
Keyword(s):  
Spectral Range ◽  
Light Extinction ◽  
Extinction Data ◽  
Aerosol Microstructure

Assessing the size distribution of droplets in a cloud chamber from light extinction data during a transient regime

2014 ◽  
Vol 109 ◽  
pp. 29-36 ◽  
Author(s):  
Sorin Nicolae Vâjâiac ◽  
Valeriu Filip ◽  
Sabina Ștefan ◽  
Andreea Boscornea
Keyword(s):  
Size Distribution ◽  
Transient Regime ◽  
Cloud Chamber ◽  
Light Extinction ◽  
Extinction Data

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

Submicron imaging in the EUV spectral range using high-harmonic radiation

2003 ◽  
Vol 104 ◽  
pp. 149-152 ◽  
Author(s):  
M. Wieland ◽  
R. Früke ◽  
T. Wilhein ◽  
U. Kleineberg ◽  
M. Pohl ◽  
...  
Keyword(s):  
Spectral Range ◽  
High Harmonic ◽  
Harmonic Radiation

Results of Spatial Structure of Atmosphere Radiation in a Spectral Range (1.5–2) µm Research

2018 ◽  
pp. 7-13
Author(s):  
Anton M. Mishchenko ◽  
Sergei S. Rachkovsky ◽  
Vladimir A. Smolin ◽  
Igor V . Yakimenko
Keyword(s):  
Spatial Structure ◽  
Unmanned Aerial Vehicle ◽  
Wavelength Range ◽  
Spectral Range ◽  
Near Ir ◽  
Optoelectronic Systems ◽  
Aerial Vehicle

Results of experimental studying radiation spatial structure of atmosphere background nonuniformities and of an unmanned aerial vehicle being the detection object are presented. The question on a possibility of its detection using optoelectronic systems against the background of a cloudy field in the near IR wavelength range is also considered.

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