Transmission Electron Microscopy and X-Ray Diffraction Studies of a,b-Axis Oriented YBa2Cu3O7-δ Films
Keyword(s):
X Ray
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ABSTRACTQuantitative high resolution transmission electron microscopy and x-ray diffraction have been used to study films of YBa2Cu3O7-δ grown on LaAlO3 substrates at low substrate temperatures. Based on analysis of high-resolution micrographs, it is asserted that the films are b-axis oriented near the film-substrate interface, and switch to a-axis oriented at some distance away from the interface, in a manner which varies from sample to sample. Thus, the films undergo a change in orientation as a function of distance from the substrate. X-ray diffraction confirms that these films contain both a-axis oriented and b-axis oriented components normal to the plane of the substrate, consistent with the high-resolution microscopy data.
1982 ◽
Vol 40
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pp. 722-723
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2001 ◽
Vol 145
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pp. 325-331
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2001 ◽
Vol 16
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pp. 1960-1966
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2009 ◽
Vol 42
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pp. 1085-1091
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2006 ◽
Vol 78
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pp. 1651-1665
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