Application of Mxcd to Magnetic Thin-Film Sensors
Keyword(s):
X Ray
◽
AbstractWhile Magnetic X-ray Circular Dichroism (MXCD) has been applied extensively to the extraction of elemental magnetic moments in various magnetic multilayers, the configuration of actual devices imposes certain constraints on the application of MXCD to devices. Using a set of real, thin-film spin valve devices with varying Cu spacer layer thicknesses, we demonstrate the correlation between MXCD and magnetoresistance measurements on those devices as well as the restrictions on the interpretation of MXCD data imposed by both the device topology and the formulation of realistic error estimates.
1999 ◽
Vol 98-99
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pp. 209-222
Keyword(s):
2002 ◽
Vol 09
(02)
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pp. 877-881
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2020 ◽
Vol 31
(08)
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pp. 2050109
2014 ◽
Vol 502
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pp. 012038
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2007 ◽
Vol 41
(2-3)
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pp. 163-167
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