Angle-resolved X-ray photoelectron spectroscopic study of the interface chemistry between ultra-thin a-C overcoat and the magnetic layer on magnetic thin film disks

1999 ◽  
Vol 98-99 ◽  
pp. 209-222
Author(s):  
J.F Ying ◽  
P.E Sobol ◽  
Z.D Yang ◽  
B.D Hermsmeier
Keyword(s):  
Thin Film ◽  
Spectroscopic Study ◽  
Magnetic Layer ◽  
Magnetic Thin Film ◽  
Interface Chemistry ◽  
X Ray

CoPt/C NANOGRANULAR MAGNETIC THIN FILM

2005 ◽  
Vol 19 (14) ◽  
pp. 2261-2271 ◽  
Author(s):  
TONG LI ◽  
HUI YAN ◽  
HAI WANG ◽  
WU ZHENG
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Carbon Matrix ◽  
Magnetic Interactions ◽  
High Coercivity ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Density Recording ◽  
Deposition Mode

Granular Co 30 Pt 70/ C and Co 45 Pt 55/ C films, consisting of nanoparticle CoPt phases embedded in a carbon matrix, have been made by co-sputtering from CoPt and C targets using a tandem deposition mode. X-ray diffraction shows the existence of hard CoPt phase embedded in an amorphous C matrix after annealing. The coercivities for CoPt/C are strongly dependent on C and Pt composition. Films with coercivity of up to 5.4 kOe and grain size of 7 nm can be obtained. The development of shoulder in hysteresis loop may be contributed to the co-existence of magnetic soft CoPt 3 and hard CoPt phases and the magnetic interactions between them. High remanence Mr/Ms (>0.8) found in our samples indicates the presence of the intergranular interactions in the samples. Observed positive contributions of δm also give evidence of the existence of exchange interaction. High coercivity and large Mr/Ms make granular CoPt/C film with magnetic nanoparticles very attractive for next-generation high-density recording.

X-ray scattering from two-dimensionally patterned magnetic thin film nanoscale arrays

2007 ◽  
Vol 41 (2-3) ◽  
pp. 163-167 ◽  
Author(s):  
D.S. Eastwood ◽  
T.P.A. Hase ◽  
M. van Kampen ◽  
R. Bručas ◽  
B. Hjörvarsson ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetic Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Composition and Lattice Constant Evaluation of the Garnet System (Dy, Gd)3Ga5O12

1972 ◽  
Vol 16 ◽  
pp. 177-185
Author(s):  
L. A. Moudy ◽  
S. B. Austerman
Keyword(s):  
Thin Film ◽  
Rare Earth ◽  
Lattice Constant ◽  
Direct Measurement ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Matching ◽  
Lattice Constants ◽  
Constant Control

AbstractCompositional and lattice constant control of non-magnetic garnet substrates are required for suitable lattice matching with epitaxially deposited magnetic thin film. Suitable substrates for this purpose are the simple and mixed rare earth garnets. Lattice constants were obtained on Czochralski grown crystals by conventional x-ray diffraction powder techniques with a precision of ± .0005Å. An x-ray fluorescence method was developed to determine crystal composition with a precision of ± 0.5 percent. The precision with which a can be determined indirectly by x-ray fluorescence is ± 0.0082Å, which is comparable with that from direct measurement.

Interface study of ion irradiated Cu/Ni/Cu(002)/Si magnetic thin film by X-ray reflectivity

2006 ◽  
Vol 299 (1) ◽  
pp. 105-111 ◽  
Author(s):  
T.G. Kim ◽  
J.H. Lee ◽  
J.H. Song ◽  
K.H. Chae ◽  
S.W. Shin ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetic Thin Film ◽  
X Ray ◽  
Interface Study

Electrodeposition of Nanocrystalline CoNiFe Thin Films Prepared by Cyclic Voltammetry

2009 ◽  
Vol 620-622 ◽  
pp. 731-734 ◽  
Author(s):  
Chao Cai ◽  
Qiu Ping Wang ◽  
Zhao Zhang ◽  
Jian Feng Yang
Keyword(s):  
Thin Film ◽  
Cyclic Voltammetry ◽  
Growth Process ◽  
Magnetic Flux Density ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
Soft Magnetic ◽  
X Ray ◽  
Xrd Techniques ◽  
Scanning Electron

The electroplating behavior of nanocrystalline CoNiFe soft magnetic thin film with high saturation magnetic flux density and low coercivity was investigated using cyclic voltammetry and chronoamperometry methods in conjunction with the scanning electron microscopy (SEM/EDX) and X-ray diffraction (XRD) techniques. The results show that, the co-deposition of CoNiFe alloy behaves anomalously. And the nucleation/growth process of CoNiFe ternary alloy followed 3D instantaneous mechanism at higher potentials, while in the case of lower potentials it followed 3D progressive mechanism.

scholarly journals Application of Mxcd to Magnetic Thin-Film Sensors

1996 ◽  
Vol 437 ◽  
Author(s):  
P. J. Bedrossian ◽  
J. G. Tobin ◽  
A. F. Jankowski ◽  
G. D. Waddill ◽  
T. C. Anthony ◽  
...  
Keyword(s):  
Thin Film ◽  
Error Estimates ◽  
Magnetic Moments ◽  
Spin Valve ◽  
Magnetic Multilayers ◽  
Magnetic Thin Film ◽  
X Ray ◽  
Thin Film Sensors ◽  
Spacer Layer ◽  
Circular Dichroïsm

AbstractWhile Magnetic X-ray Circular Dichroism (MXCD) has been applied extensively to the extraction of elemental magnetic moments in various magnetic multilayers, the configuration of actual devices imposes certain constraints on the application of MXCD to devices. Using a set of real, thin-film spin valve devices with varying Cu spacer layer thicknesses, we demonstrate the correlation between MXCD and magnetoresistance measurements on those devices as well as the restrictions on the interpretation of MXCD data imposed by both the device topology and the formulation of realistic error estimates.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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