scholarly journals Релаксация поляризации при статическом прямом флексоэлектрическом эффекте в монокристалле SrTiO-=SUB=-3-=/SUB=-

2021 ◽  
Vol 63 (10) ◽  
pp. 1560
Author(s):  
В.Г. Залесский ◽  
Е.Д. Обозова ◽  
А.Д. Полушина ◽  
П.П. Сырников

The results of a study of the dielectric polarization induced by spherical bending of thin single-crystal SrTiO3 plates are presented, and the flexoelectric coefficients are estimated. The processes of relaxation of inhomogeneous deformation and induced polarization are investigated.

Geophysics ◽  
1996 ◽  
Vol 61 (1) ◽  
pp. 66-73 ◽  
Author(s):  
Richard S. Smith ◽  
Jan Klein

Airborne induced‐polarization (IP) measurements can be obtained with standard time‐domain airborne electromagnetic (EM) equipment, but only in the limited circumstances when the ground is sufficiently resistive that the normal EM response is small and when the polarizability of the ground is sufficiently large that the IP response can dominate the EM response. Further, the dispersion in conductivity must be within the bandwidth of the EM system. One example of what is hypothesized to be IP effects are the negative transients observed on a GEOTEM® survey in the high arctic of Canada. The dispersion in conductivity required to explain the data is very large, but is not inconsistent with some laboratory measurements. Whether the dispersion is caused by an electrolytic or dielectric polarization is not clear from the limited ground follow‐up, but in either case the polarization can be considered to be induced by eddy currents associated with the EM response of the ground. If IP effects are the cause of the negative transients in the GEOTEM data, then the data can be used to estimate the polarizabilities in the area.


2021 ◽  
Author(s):  
T. O. Lipateva ◽  
A. S. Lipatiev ◽  
S. S. Fedotov ◽  
A. G. Okhrimchuk ◽  
S. V. Lotarev ◽  
...  

2020 ◽  
Author(s):  
Dongji Lei ◽  
Jian Li ◽  
Hui Meng ◽  
Yajuan Wang

Abstract As an emerging geophysical exploration method, complex resistivity method is a potential non-invasive one for evaluating hydrofracturing effect. Reactance X is an important parameter of complex resistivity method. Compared with the traditional parameter resistance R, reactance has advantages such as distinct dispersion characteristics, clear conduction mechanism and rich information. In this paper, reactance X of four kinds of coal sample with different water saturation was tested, their dispersion characteristics were analyzed, and their conductive mechanism was studied. The results show that, (1) the characteristic curve of reactance dispersion presents a three-stage law when the water saturation is low, and a two-stage law when the water saturation is high,to some extent, the water content of coal body and the effect of hydraulic fracturing are distinguished;(2) polarization is the cause of dispersion, in which low frequency is induced polarization, high frequency is dielectric polarization, and electromagnetic induction is the interference phenomenon in the frequency band of induced polarization; (3) spectrum extremum frequency point is sensitive to changed water saturation. Extremum points of different coal rank are concentrated in 100-1000Hz. This frequency band can serve as the dominant frequency band for evaluating coal seam water saturation. This paper gives new insight into the evaluation of coal seam hydrofracturing effect by complex resistivity method.


2013 ◽  
Vol 375 ◽  
pp. 20-25 ◽  
Author(s):  
Indranil Bhaumik ◽  
Gurvinderjit Singh ◽  
S. Ganesamoorthy ◽  
R. Bhatt ◽  
A.K. Karnal ◽  
...  

1995 ◽  
Vol 401 ◽  
Author(s):  
C. M. Foster ◽  
G.-R. Bai ◽  
Z. Li ◽  
R. Jammy ◽  
L. A. Wills ◽  
...  

AbstractSingle-crystal thin films covering the full compositional range of Pb(ZrxTi1−x)O3(PZT) 0≤x≤1 have been deposited by metal-organic chemical vapor deposition (MOCVD). The films were grown on epitaxial, RF-sputter-deposited SrRuO3 thin film electrodes on (001) SrTiO3 substrates. X-ray diffraction (XRD), energy-dispersive electron spectroscopy (EDS) and optical waveguiding were used to characterize the crystalline structure, composition, refractive index, and film thickness of the deposited films. We found that the PZT films were single-crystalline for all compositions exhibiting cube-on-cube epitaxy with the substrate with very high degrees of crystallinity and orientation. We report the systematic variations in the optical, dielectric, polarization, and transport properties as a function of composition and the epitaxy-induced modifications in the solid-solution phase diagram of this system. These films exhibited electronic properties which showed clear systematic variations with composition. High values of remnant polarization (30–55 μC/cm2) were observed at all ferroelectric compositions. Unlike previous studies, the dielectric constant exhibited a clear dependence on composition with values ranging from 225–650. The coercive fields decreased with increasing Zr concentration to a minimum of 20 kV/cm at the (70/30) composition. In addition, these films exhibited both high resistivity and dielectric-breakdown strength (˜1013 Ω-cm at 100 kV/cm and >300 kV/cm, respectively) without any compensative doping.


Author(s):  
Akira Tanaka ◽  
David F. Harling

In the previous paper, the author reported on a technique for preparing vapor-deposited single crystal films as high resolution standards for electron microscopy. The present paper is intended to describe the preparation of several high resolution standards for dark field microscopy and also to mention some results obtained from these studies. Three preparations were used initially: 1.) Graphitized carbon black, 2.) Epitaxially grown particles of different metals prepared by vapor deposition, and 3.) Particles grown epitaxially on the edge of micro-holes formed in a gold single crystal film.The authors successfully obtained dark field micrographs demonstrating the 3.4Å lattice spacing of graphitized carbon black and the Au single crystal (111) lattice of 2.35Å. The latter spacing is especially suitable for dark field imaging because of its preparation, as in 3.), above. After the deposited film of Au (001) orientation is prepared at 400°C the substrate temperature is raised, resulting in the formation of many square micro-holes caused by partial evaporation of the Au film.


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