scholarly journals 2-Phenylimidazole Corrosion Inhibitor on Copper: An XPS and ToF-SIMS Surface Analytical Study

Coatings ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 966
Author(s):  
Matjaž Finšgar
Keyword(s):  
Surface Layer ◽  
Corrosion Inhibitor ◽  
Photoelectron Spectroscopy ◽  
Analytical Study ◽  
Ion Beam ◽  
Principal Component ◽  
Ion Beam Sputtering ◽  
Organometallic Complex ◽  
Xps Spectra ◽  
Tof Sims

This work presents a surface analytical study of the corrosion inhibitor 2-phenylimidazole (2PhI) adsorbed on a Cu surface from 3 wt.% NaCl solution. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to investigate the surface phenomena. Various XPS experiments were performed, i.e., survey- and angle-resolved high-resolution XPS spectra measurements, gas cluster ion beam sputtering in conjunction with XPS measurements, and XPS imaging in conjunction with principal component analysis. These measurements were used to detail the composition of the surface layer at depth. In addition, various ToF-SIMS experiments were performed, such as positive ion ToF-SIMS spectral measurements, ToF-SIMS imaging, and cooling/heating in conjunction with ToF-SIMS measurements. This study shows that organometallic complexes were formed between 2PhI molecules and Cu ions, that the surface layer contained entrapped NaCl, that the surface layer contained some Cu(II) species (but the majority of species were Cu(I)-containing species), that the surface was almost completely covered with a combination of 2PhI molecules and organometallic complex, and that the temperature stability of these species increases when 2PhI is included in the organometallic complex.

scholarly journals The Interface Characterization of 2-Mercapto-1-methylimidazole Corrosion Inhibitor on Brass

Coatings ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 295
Author(s):  
Matjaž Finšgar
Keyword(s):  
Surface Layer ◽  
Corrosion Inhibitor ◽  
Photoelectron Spectroscopy ◽  
Related Species ◽  
Surface Characterization ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Xps Analysis ◽  
Spectral Interferences ◽  
Tof Sims

This work presents a detailed surface analytical study and surface characterization, with an emphasis on the X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analyses of 2‑mercapto‑1‑methylimidazole (MMI) as a corrosion inhibitor for brass. First, the electrochemical measurements demonstrated a corrosion inhibition effect of MMI in a 3 wt.% NaCl solution. Next, the formation of the MMI surface layer and its properties after 1 month of immersion was analyzed with attenuated total reflectance–Fourier-transform infrared spectroscopy, atomic force microscopy, field-emission scanning electron microscopy, and contact angle analysis. Moreover, to gradually remove the organic surface layer, a gas cluster ion beam (GCIB) sputtering source at different accelerated voltages and cluster sizes was employed. After each sputtering cycle, a high-resolution XPS analysis was performed. Moreover, an angle‑resolved XPS analysis was carried out for the MMI-treated brass sample to analyze the heterogeneous layered structure (the interface of the MMI organic/inorganic brass substrate). The interface properties were also investigated in detail using ToF-SIMS for spectra measurements and 2D imaging. Special attention was devoted to the possible spectral interferences for MMI‑related species. The thermal stability of different MMI-related species using molecular-specific signals without possible spectral interferences was determined by performing a cooling/heating experiment associated with ToF-SIMS measurements. It was shown that these species desorbed from the brass surface in the temperature range of 310–370 °C.

X-ray Photoelectron Spectroscopy (XPS) Investigation of the Surface Film on Magnesium Powders

2012 ◽  
Vol 66 (5) ◽  
pp. 510-518 ◽  
Author(s):  
Paul J. Burke ◽  
Zeynel Bayindir ◽  
Georges J. Kipouros
Keyword(s):  
Surface Layer ◽  
Photoelectron Spectroscopy ◽  
Focused Ion Beam ◽  
Surface Film ◽  
Ion Beam ◽  
Pure Magnesium ◽  
Atmospheric Conditions ◽  
Magnesium Powder ◽  
X Ray ◽  
Aerospace Applications

Magnesium (Mg) and its alloys are attractive for use in automotive and aerospace applications because of their low density and good mechanical properties. However, difficulty in forming magnesium and the limited number of available commercial alloys limit their use. Powder metallurgy may be a suitable solution for forming near-net-shape parts. However, sintering pure magnesium presents difficulties due to surface film that forms on the magnesium powder particles. The present work investigates the composition of the surface film that forms on the surface of pure magnesium powders exposed to atmospheric conditions and on pure magnesium powders after compaction under uniaxial pressing at a pressure of 500 MPa and sintering under argon at 600 °C for 40 minutes. Initially, focused ion beam microscopy was utilized to determine the thickness of the surface layer of the magnesium powder and found it to be ∼10 nm. The X-ray photoelectron analysis of the green magnesium sample prior to sintering confirmed the presence of MgO, MgCO3·3H2O, and Mg(OH)2 in the surface layer of the powder with a core of pure magnesium. The outer portion of the surface layer was found to contain MgCO3·3H2O and Mg(OH)2, while the inner portion of the layer is primarily MgO. After sintering, the MgCO3·3H2O was found to be almost completely absent, and the amount of Mg(OH)2 was also decreased significantly. This is postulated to occur by decomposition of the compounds to MgO and gases during the high temperature of sintering. An increase in the MgO content after sintering supports this theory.

Post-Process Modification of CeOx/C-Supported PtCu Thin Film Catalyst and Its Catalytic Activity for Hydrogen Evolution Reaction

NANO ◽  
2015 ◽  
Vol 10 (06) ◽  
pp. 1550082 ◽  
Author(s):  
Yumeng Zhao ◽  
Bin Yang ◽  
Xinyu Hao ◽  
Zhijing Zhao
Keyword(s):  
Thin Film ◽  
Catalytic Activity ◽  
Hydrogen Evolution ◽  
Hydrogen Evolution Reaction ◽  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Nanoporous Structure ◽  
Root Mean Square Roughness ◽  
Ion Beam Sputtering ◽  
Process Modification

CeO x/ C supported PtCu thin film catalysts were prepared by ion beam sputtering (IBS) and subsequently annealed at 400°C under vacuum environment and electrochemically dealloyed. Scanning transmission electronic microscope (STEM) and atomic force microscope (AFM) characterizations show that the surface of post-processed catalyst presents nanoporous structure and has a high root mean square roughness (RMS = 13.9nm). Electrochemical measurements indicate that the post-processed PtCu – CeO x/ C catalyst shows higher catalytic activity towards hydrogen evolution reaction than pure Pt / C . While inductively coupled plasma atomic emission spectroscopy (ICP-AES) analysis displays that the platinum ( Pt ) loading of the post-processed PtCu – CeO x/ C is 0.1192mg/cm2, decreasing by 20% compare to pure Pt / C (0.1490mg/cm2). X-ray photoelectron spectroscopy (XPS) analysis confirms that the surface of post-processed PtCu – CeO x/ C enrich Pt and analyzes the chemical valence of Pt element using depth profiling technology. It can be inferred that the enhancement in catalytic property is attributed to the combined action between geometric structure effect and electronic modification effect of Pt atoms from CeO x support.

Adhesion of Copper to Polytetrafluoroethylene

1989 ◽  
Vol 153 ◽  
Author(s):  
Yong-Kil Kim ◽  
Chin-An Chang ◽  
A.G. Schrott ◽  
J. Andreshak ◽  
M. Cali
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Peel Test ◽  
Peel Strength ◽  
Interface Morphology ◽  
Ion Beam Sputtering ◽  
Polymer Substrates ◽  
X Ray ◽  
Beam Sputtering ◽  
Scanning Electron

AbstractAn enhancement of the adhesion between copper and polytetrafluoroethylene (PTFE) has been studied. Thin-films of copper were electron-beam deposited on the surface of the polymer substrates. Peel test measurements showed that, without any treatment of the substrates, the adhesion was poor with a peel strength of 1-2 g/mm. A pronounced enhancement of the adhesion has been obtained when the fluorocarbon substrates were treated by either an ultraviolet (UV) irradiation, an ion-beam presputtering prior to the metal deposition, or heat treatments after the deposition. Among the treatments employed, the ion-beam sputtering was the most effective in improving the adhesion. The roles of the treatments and possible reasons for the enhanced adhesion are discussed in conjunction with the studies of interface morphology and chemistry using Scanning Electron Microscopy, Rutherford Backscattering Spectroscopy, and X-ray Photoelectron Spectroscopy.

Adhesion of Copper to Polytetrafluoroethylene

1989 ◽  
Vol 154 ◽  
Author(s):  
Yong-Kil Kim ◽  
Chin-An Chang ◽  
A. G. Schrott ◽  
J. Andreshak ◽  
M. Cali
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Peel Test ◽  
Peel Strength ◽  
Interface Morphology ◽  
Ion Beam Sputtering ◽  
Polymer Substrates ◽  
X Ray ◽  
Beam Sputtering ◽  
Scanning Electron

AbstractAn enhancement of the adhesion between copper and polytetrafluoroethylene (PTFE) has been studied. Thin-films of copper were electron-beam deposited on the surface of the polymer substrates. Peel test measurements showed that, without any treatment of the substrates, the adhesion was poor with a peel strength of 1–2 g/mm. A pronounced enhancement of the adhesion has been obtained when the fluorocarbon substrates were treated by either an ultraviolet (UV) irradiation, an ion-beam presputtering prior to the metal deposition, or heat treatments after the deposition. Among the treatments employed, the ion-beam sputtering was the most effective in improving the adhesion. The roles of the treatments and possible reasons for the enhanced adhesion are discussed in conjunction with the studies of interface morphology and chemistry using Scanning Electron Microscopy, Rutherford Backscattering Spectroscopy, and X-ray Photoelectron Spectroscopy.

scholarly journals Свойства мемристивных структур на основе нанокомпозита (Co-=SUB=-40-=/SUB=-Fe-=SUB=-40-=/SUB=-B-=SUB=-20-=/SUB=-)-=SUB=-x-=/SUB=-(LiNbO-=SUB=-3-=/SUB=-)-=SUB=-100-x-=/SUB=-, синтезированных на SiO-=SUB=-2-=/SUB=-/Si-подложках

2020 ◽  
Vol 90 (2) ◽  
pp. 257
Author(s):  
С.Н. Николаев ◽  
А.В. Емельянов ◽  
Р.Г. Чумаков ◽  
В.В. Рыльков ◽  
А.В. Ситников ◽  
...  
Keyword(s):  
Resistive Switching ◽  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Microscopic Analysis ◽  
Structural Features ◽  
Growth Direction ◽  
Ion Beam Sputtering ◽  
Electron Microscopic ◽  
Composite Target ◽  
Si Substrates

The structural features and I-V curves of a metal/nanocomposite/metal (M/NC/M) sandwiches based on NC (Co40Fe40B20)x(LiNbO3)100-x synthesized on SiO2/Si substrates are investigated. Samples M/NC/M were obtained by the method of ion beam sputtering of a composite target which allows to form NC of different composition in the range x = 5–48 at. %. Electron microscopic analysis showed that the matrix consists of metal granules in an amorphous nonstoichiometric matrix. The granules have a size of d~2–3 nm and have a shape close to spherical with a slight elongation along the growth direction. The local chemical composition of NC films was studied by X-ray photoelectron spectroscopy. The structures demonstrate the effect of resistive switching with the maximum value Roff / Ron≈10, observed at the metal content is x ~ 13 at. %. The number of write/erase cycles was more than 10^4. Observed effect of resistive switching is explain by the oxygen vacancies action on the tunnel conductivity of the contacts of granules percolation chains with one of structure electrode separated from the NC by a strongly oxidized layer.

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