scholarly journals The Inverse Task for Magnetic Force Microscopy Data

2013 ◽  
Vol 328 ◽  
pp. 744-747 ◽  
Author(s):  
Konstantin Nefedev ◽  
Vitalii Y. Kapitan ◽  
Yuriy Shevchenko
Keyword(s):  
Linear Dependence ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Moments ◽  
Dipole Interaction ◽  
Computer Processing ◽  
Force Microscopy ◽  
Microscopy Data

The computer processing of cobalt nanodots magnetic force microscopy was fulfilled. The solution of reverse task of magnetic force microscopy is obtained for surface nanosystems. Superposition of fields, which are generated by a system of magnetic moments in the selected point in space, causes a linear dependence of the force gradient of the dipole-dipole interaction between the components of the vectors.

Atomic Force Microscopy Probe with Integrated Loop and Shielded Leads for Micromagnetic Sensing

2005 ◽  
Vol 872 ◽  
Author(s):  
D.P. Lagally ◽  
A. Karbassi ◽  
Y. Wang ◽  
C.A. Paulson ◽  
D. W. van der Weide
Keyword(s):  
Magnetic Resonance ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
High Spatial Resolution ◽  
Magnetic Moments ◽  
Chemical Species ◽  
Magnetic Resonance Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Magnetic Resonance Imaging Mri

The effort to produce an instrument that can achieve high spatial resolution, nondestructive, surface and sub-surface imaging for a variety of materials comes with many challenges. One approach, magnetic resonance-force microscopy (MRFM), lies at the nexus of two sensitive technologies: magnetic force microscopy (MFM) and magnetic resonance imaging (MRI). MFM uses a magnetic tip in a standard atomic force microscope (AFM) to obtain magnetic information about a surface. A difference in the magnetic moments of surface atoms in different regions on the surface varies the cantilever resonance. MRI, on the other hand, uses the spin states of magnetically biased atoms to differentiate between chemical species.

Investigation of Magnetization Distribution in Co/Au Multilayer Film by Magnetic Force Microscopy

2009 ◽  
Vol 152-153 ◽  
pp. 277-280
Author(s):  
N. Nurgazizov ◽  
P. Zhdan ◽  
M. Kisielewski ◽  
Feliks Stobiecki
Keyword(s):  
Magnetic Moment ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Multilayer Film ◽  
Magnetic Moments ◽  
Magnetization Distribution ◽  
Double Pass ◽  
Force Microscopy ◽  
Single Pass ◽  
Au Film

Results obtained during examination of the multilayer Co/Au film by different methods of Magnetic Force Microscopy (MFM) are presented. It was shown, that double-pass scanning with MFM tips, characterised by strong magnetic moments resulted in a magnetisation reversal of the sample during MFM imaging. Single pass scanning or use of the MFM tips with low magnetic moments was required to minimise this process. Experimental results demonstrated good correlation between MFM results acquired during single-pass scanning and double-pass scanning with MFM tips characterised by low magnetic moment.

The Remagnetization Process Feature of Trilayer Nanodisks

2010 ◽  
Vol 168-169 ◽  
pp. 249-252
Author(s):  
A.V. Ognev ◽  
M.E. Stebliy ◽  
A.S. Samardak ◽  
A. Nogaret ◽  
L.A. Chebotkevich
Keyword(s):  
Kerr Effect ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Moments ◽  
Force Microscopy ◽  
Vortex States ◽  
Reversal Process ◽  
Ferromagnetic Layers

The remagnetization process and the distribution of magnetic moments in arrays of trilayer nanodisks Co(10 nm)/Pd(0.8 nm)/Co(10 nm) with diameters D = 200 and 400 nm were studied by the magnetooptical Kerr effect (MOKE) and magnetic force microscopy (MFM). It is shown that in the nanodisks with D = 200 nm the magnetisation reversal process can be carried out by the vortex states or one-domain configurations with the antiparallel orientation of moments in the adjacent ferromagnetic layers. In arrays of nanodisks with D = 400 nm the vortex states are formed only.

Test of response linearity for magnetic force microscopy data

2002 ◽  
Vol 92 (3) ◽  
pp. 1256-1261 ◽  
Author(s):  
R. Yongsunthon ◽  
E. D. Williams ◽  
J. McCoy ◽  
R. Pego ◽  
A. Stanishevsky ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Microscopy Data

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

scholarly journals Magnetic Force Microscopy: Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes (Small 11/2020)

Small ◽  
2020 ◽  
Vol 16 (11) ◽  
pp. 2070058
Author(s):  
Héctor Corte‐León ◽  
Volker Neu ◽  
Alessandra Manzin ◽  
Craig Barton ◽  
Yuanjun Tang ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

Magnetic Domain Observation on Melt-Spun Nd-Fe-B Ribbons Using Magnetic Force Microscopy

1999 ◽  
Vol 577 ◽  
Author(s):  
A. Gavrin ◽  
C. Sellers ◽  
S.H. Liouw
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Measurements ◽  
Magnetic Domain ◽  
Domain Size ◽  
High Coercivity ◽  
Uniform Domain ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Melt Spun

ABSTRACTWe have used Magnetic Force Microscopy (MFM) to study the magnetic domain structures of melt-spun Nd-Fe-B ribbons. The ribbons are commercial products (Magnequench International, Inc. MQP-B and MQP-B+) with a thickness of approximately 20 microns. These materials have identical composition, Nd12.18B5.36Fe76.99Co5.46, but differ in quenching conditions. In order to study the distribution of domain sizes through the ribbon thickness, we have prepared cross-sectional samples in epoxy mounts. In order to avoid artifacts due to tip-sample interactions, we have used high coercivity CoPt coated MFM tips. Our studies show domain sizes typically ranging from 50-200 nm in diameter. This is in agreement with studies of similar materials in which domains were investigated in the plane of the ribbon. We also find that these products differ substantially in mean domain size and in the uniformity of the domain sizes as measured across the ribbon. While the B+ material shows nearly uniform domain sizes throughout the cross section, the B material shows considerably larger domains on one surface, followed by a region in which the domains are smaller than average. This structure is presumably due to the differing quench conditions. The region of coarse domains varies in thickness, disappearing in some areas, and reaching a maximum thickness of 2.75 µm in others. We also describe bulk magnetic measurements, and suggest that.

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