Research on Accelerated Life Test System for Water Quality Analyzer

2014 ◽  
Vol 635-637 ◽  
pp. 738-741
Author(s):  
Guang Yue Shen ◽  
Jian Miao ◽  
Jian Wen Shao
Keyword(s):  
Water Quality ◽  
Computer Software ◽  
Test System ◽  
Accelerated Life Test ◽  
Reliability Test ◽  
System Control ◽  
Life Test ◽  
Accelerated Life ◽  
Quality Analyzer ◽  
Upper Computer

This research proposes an Accelerated Life Test System and has realized the reliability test of water quality analyzer. ALT (Accelerated Life Test) system is based on the principle of step stress accelerated life test and takes temperature as the accelerated stress. The system includes lower computer PLC and upper computer software of MCGS. In this research, Upper computer using configuration software to connect with the SIEMENS S7-300 PLC, in order to realize data acquisition and system control. This system improves the reliability test efficiency of the water quality analyzer, reduces the cost of test and has good economic efficiency.

Study of High-Power White LED's Lifetime Based on Accelerated Life Test

2013 ◽  
Vol 800 ◽  
pp. 205-209 ◽  
Author(s):  
De Sheng Li ◽  
Nian Yu Zou ◽  
Yun Cui Zhang ◽  
Xiao Yang He ◽  
Yi Yang
Keyword(s):  
High Power ◽  
Accelerated Life Test ◽  
Reliability Test ◽  
White Led ◽  
Life Test ◽  
Arrhenius Model ◽  
White Leds ◽  
Accelerated Life ◽  
Temperature Levels

The study of LED reliability becomes more and more important with LED widely used in various areas, and accelerated life test (ALT) as an element of reliability test is widely used to predict the lifetime of LED. In this paper, ALTs have been carried out at various current levels and various temperature levels. In the current ALT experiment, three kinds of stressing currents were demonstrated for 1W white LEDs and lumen flux of the tested LEDs were studied, and based on Eyting model, lifetime of the tested LEDs is calculated about 6.86×105h. In the temperature ALT experiment, two kinds of stressing temperature were demonstrated for the same type of white LEDs and lumen flux were also studied, and based on Arrhenius model, lifetime of the tested LEDs is calculated about 7.41×105h. In addition, the color shifting velocity is faster than lumens depreciation velocity was observed in our experiment, which means the lifetime evaluating of white LED should be paid more attention.

scholarly journals Current Status and Prospects of Reliability Test Research on Special Computers

2021 ◽  
Vol 261 ◽  
pp. 01054
Author(s):  
Chao Li
Keyword(s):  
Industrial Development ◽  
Developed Countries ◽  
Accelerated Life Test ◽  
Quality Analysis ◽  
Current Status ◽  
Reliability Test ◽  
Life Test ◽  
Key Technology ◽  
Accelerated Life ◽  
Computer Reliability

Special computers are widely used in aerospace, ships, weapons and other fields. More and more attention is paid to the reliability of special computers. Although my country started late in this regard, it has achieved some results after continuous exploration by a large number of scientific research institutions, and has gradually kept up with the pace of research in developed countries. This article first summarizes the research status and importance of accelerated life test in reliability test research, and analyzes the key technology and development of reliability test of special computer. Reliability analysis can solve the failure problems that cannot be explained by traditional quality analysis methods, and will surely make remarkable achievements in the future industrial development. The summary of this article will provide theoretical reference for subsequent related research.

Analysis of Constant-Stress Accelerated-Life-Test Data of Electric Appliances

2011 ◽  
Vol 268-270 ◽  
pp. 51-55
Author(s):  
Jing Zhao ◽  
Li Hua Sun ◽  
Yong Chun Liang ◽  
Cai Hong Yan ◽  
Hui Wang
Keyword(s):  
Test Data ◽  
Shape Parameter ◽  
Model Fitting ◽  
Computer Software ◽  
Constant Stress ◽  
Accelerated Life Test ◽  
Analysis Method ◽  
Reliability Engineering ◽  
Life Test ◽  
Accelerated Life

In the field of electric appliances’ reliability, the constant-stress accelerated-life-test is commonly used to test the reliability of electric appliances. A new analysis method based on constructed data is introduced to analyze the constant-stress accelerated-life-test data of electric appliances under Weibull distribution. The correlation between shape parameter and characteristic life is took into account and the estimated value of characteristic life is modified, which increase the model fitting optimization and improve the analysis precision. Moreover, the method avoids table lookup and is easy to be realized by computer software in the application of reliability engineering for electric appliances.

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