Microstructural and Electrical Conductivity of Annealed ZnO Thin Films

2014 ◽  
Vol 970 ◽  
pp. 120-123 ◽  
Author(s):  
Peh Ly Tat ◽  
Karim bin Deraman ◽  
Wan Nurulhuda Wan Shamsuri ◽  
Rosli Hussin ◽  
Zuhairi Ibrahim
Keyword(s):  
Thin Films ◽  
Low Cost ◽  
Sol Gel ◽  
Hexagonal Wurtzite Structure ◽  
Dip Coating ◽  
Zno Thin Films ◽  
Zno Films ◽  
Axis Orientation ◽  
Glass Substrates ◽  
Afm Micrographs

Undoped nanocrystalline ZnO thin films were deposited onto the glass substrates via the low cost sol-gel dip coating method. The as-grown ZnO films were annealed at the temperatures ranging from 400 °C to 550 °C. The X-ray diffraction (XRD) pattern revealed that the annealed ZnO films were polycrystalline with hexagonal wurtzite structure and majority preferentially grow along (002) c-axis orientation. Atomic force microscopy (AFM) micrographs showed the improvement of RMS roughness and grain size as annealing temperature increased. The ZnO films that annealed at 500 oC exhibited the lowest resistivity value.

The Structural and Surface Morphology of Annealed ZnO Films

2014 ◽  
Vol 903 ◽  
pp. 73-77
Author(s):  
Peh Ly Tat ◽  
Karim bin Deraman ◽  
Rosli Hussin ◽  
Wan Nurulhuda Wan Shamsuri ◽  
Zuhairi Ibrahim
Keyword(s):  
Annealing Temperature ◽  
Sol Gel ◽  
Dip Coating ◽  
Zno Films ◽  
Axis Orientation ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Coating Method ◽  
Afm Micrographs ◽  
Dip Coating Method

ZnO thin films were deposited on the glass substrates via the sol-gel dip coating method. The films were annealed at various temperatures ranging from 350 °C to 550 °C. X-ray diffraction (XRD), and atomic force microscopy (AFM) were used to investigate the effect of annealing temperature on the structural and morphology properties of the films. The as grown films exhibited amorphous pattern while annealed films were polycrystalline structure with (002) preferential growth along c-axis orientation. The AFM micrographs revealed that the RMS roughness of the films increased as the annealing temperature increased. The grain size was ranging from 32.1 nm to 176.0 nm as the annealing temperature increased from 350 °C to 450 °C and decreased to 56.1 nm for 550 °C.

Growth and Characterisation of Nanocrystalline ZnO Thin Films by Dip Coating Technique

2013 ◽  
Vol 832 ◽  
pp. 368-373
Author(s):  
Mohd Firdaus Malek ◽  
Mohamad Hafiz Mamat ◽  
Mohd Zainizan Sahdan ◽  
Musa Mohamed Zaihidi ◽  
Zuraida Khusaimi ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Acetate ◽  
Sol Gel ◽  
Homogeneous Solution ◽  
Nir Spectroscopy ◽  
Dip Coating ◽  
Zno Thin Films ◽  
Molar Ratio ◽  
Zno Films ◽  
Glass Substrates

Nanocrystalline zinc oxide (ZnO) thin films have been obtained by the sol gel process. A stable and homogeneous solution was prepared by dissolving zinc acetate dehydrate as a starting material in a solution of 2-methoxyethanol and monoethanolamine (MEA). The molar concentration of zinc acetate was fixed at 0.6 mol/L while the molar ratio of MEA to zinc acetate was kept at 1:1. The films were deposited by various deposition speeds by dip-coating on glass substrates, and subsequently transformed into nanocrystalline pure ZnO films after a thermal treatment. Various deposition speeds were selected as the parameter to optimize the thin films quality. The structural and optical properties of the ZnO films were studied by X-ray diffraction (XRD), UV-Vis-NIR spectroscopy, respectively. The electrical properties of the ZnO thin films were characterised by dc 2 probing system and power supply (Advantest R6243). It was found that the deposition speed affects the resultant properties of ZnO thin films.

Influence of Ni Doping on Structural, Morphological and Optical Properties of Sol-Gel ZnO Thin Films

2016 ◽  
Vol 675-676 ◽  
pp. 241-244 ◽  
Author(s):  
Tanattha Rattana ◽  
Sumetha Suwanboon ◽  
Chittra Kedkaew
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Surface Morphology ◽  
Doping Concentration ◽  
Sol Gel ◽  
Hexagonal Wurtzite Structure ◽  
Dip Coating ◽  
Zno Thin Films ◽  
Ni Doping ◽  
Coating Method

Ni-doped ZnO thin films were prepared on glass slide substrates by a sol-gel dip coating method with different Ni doping concentrations (0-33 mol%). The effect of Ni doping concentration on structural, surface morphology and optical properties of the thin films was characterized by XRD, FESEM and UV-Vis spectrophotometer. The XRD results indicated that pure ZnO thin film exhibited a hexagonal wurtzite structure. Ni (OH)2 phase were observed at a high Ni doping concentration. The FESEM images showed that the surface morphology and surface roughness were sensitive to the Ni doping concentration. The optical transmission measurements were observed that the transmittance decreased with increasing the Ni doping concentration.

scholarly journals Multifractal analysis of ZnO thin films doped with Mg deposited by sol-gel spin coating on a glass substrate

2021 ◽  
Author(s):  
Ştefan Ţălu ◽  
Samah Boudour ◽  
Idris Bouchama ◽  
Bandar Astinchap ◽  
Hamta Ghanbaripour
Keyword(s):  
Thin Films ◽  
Spin Coating ◽  
Multifractal Analysis ◽  
Sol Gel ◽  
Three Dimensional ◽  
Hexagonal Wurtzite Structure ◽  
Morphological Properties ◽  
Zno Thin Films ◽  
Axis Orientation ◽  
Mg Doping

Abstract A multifractal analysis has been performed on the three-dimensional surface microtexture of the ZnO thin films doped with Mg deposited by sol-gel spin coating on glass substrates. The effects of Mg doping element with amounts of 0, 2, 4, and 5 % on structural and morphological properties of the coated films were investigated. From the X-ray diffraction pattern analysis, it was found that the obtained thin films had a polycrystalline hexagonal wurtzite structure with preferential c-axis orientation and increased grain size with increasing the Mg doping. From scanning electron microscopy (SEM) analysis, it can be concluded that the surface of coated thin films had dense and uniformly distributed grains of nanoscale without any cracks over all surfaces of coated firms. From atomic force microscope (AFM) analysis, it can be also concluded that the surface of coated thin films had a dense columnar grain growth uniformly distributed over the entire 1 µm ⋅ 1 µm - scanned area. The surface microtexture was characterized in terms of multifractal analysis.

Effect of Ruthenium Concentration on Structural and I-V Characteristics of ZnO Thin Films by Sol–Gel Method

2017 ◽  
Vol 05 (01) ◽  
pp. 1750004
Author(s):  
R. Vettumperumal ◽  
S. Kalyanaraman ◽  
R. Thangavel
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Zno Thin Films ◽  
Zno Films ◽  
X Ray Diffraction ◽  
Axis Orientation ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Doped Zno

Nanocrystalline ruthenium (Ru)-doped ZnO thin films on sapphire substrate was prepared using sol–gel method by spin coating technique. The structural and I-V characteristics of Ru doped ZnO thin films were studied from the X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM) analysis and Raman spectroscopy. X-ray diffraction (XRD) results revealed that the deposited films belonged to hexagonal wurtzite structure with c-axis orientation. It is also confirmed from the Raman spectra. Enhancement of longitudinal optical (LO) phonon is observed by the strong electron–phonon interaction. An observed increment in sheet resistance with increase in dopant percentage of Ru (1–2[Formula: see text]mol%) in ZnO films was found and better I-V characteristic behavior was observed at 1[Formula: see text]mol% of Ru-doped ZnO thin films. Trap limited current flow inside the material was calculated from the log I versus log V plot in the higher voltage region.

Effect of Transition Metals on the Mechanical Properties of ZnO Thin Films, Prepared by Sol-Gel Method

2020 ◽  
Vol 65 ◽  
pp. 27-38
Author(s):  
Sara Benzitouni ◽  
Mourad Zaabat ◽  
Jean Ebothé ◽  
Abdelhakim Mahdjoub ◽  
Meriem Guemini
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Transition Metals ◽  
Occupation Number ◽  
Sol Gel ◽  
Visible Region ◽  
Hexagonal Wurtzite Structure ◽  
Dip Coating ◽  
Zno Thin Films ◽  
Nanoelectromechanical Systems

Undoped and transition metals (TM = Cr, Ni, Mn and Cd) doped zinc oxide (ZnO) thin films were prepared by sol-gel dip-coating method on glass substrates at 300 °C. In this study, the effect of dopant material on the structural, morphological, optical, electrical and mechanical properties of ZnO thin films is investigated by using XRD, AFM, UV-Vis, Hall effect and nanoindentation techniques, respectively. Nanocrystalline films with a ZnO hexagonal wurtzite structure and two preferred orientations (002) and (103) were obtained. UV-Vis transmittance spectra showed that all the films are highly transparent in the visible region (> 80 %). Moreover, the optical band gap of the films decreased to 3.13 eV with an increasing orbital occupation number of 3d electrons. AFM-topography shows that the films are dense, smooth and uniform, except for the high roughness RMS =26.3 nm obtained for Cd-doped ZnO. Finally, the dopant material is found to have a significant effect on the mechanical behavior of ZnO as compared to the undoped material. For Ni and Cd dopants, analysis of load and unload data yields an increase in the hardness (8.96 ± 0.22 GPa) and Young’s modulus (122 ± 7.46 GPa) of ZnO as compared to Cr and Mn dopants. Therefore, Ni and Cd are the appropriate dopants for the design and application of ZnO-based nanoelectromechanical systems.

ANNEALING TREATMENT OF ZnO THIN FILMS DEPOSITED BY SOL–GEL METHOD

2012 ◽  
Vol 19 (05) ◽  
pp. 1250055 ◽  
Author(s):  
M. SALEEM ◽  
L. FANG ◽  
Q. L. HUANG ◽  
D. C. LI ◽  
F. WU ◽  
...  
Keyword(s):  
Thin Films ◽  
Spin Coating ◽  
Annealing Temperature ◽  
Optical Band Gap ◽  
Sol Gel ◽  
Annealing Treatment ◽  
Zno Thin Films ◽  
Axis Orientation ◽  
Transmittance Spectra ◽  
Glass Substrates

Highly transparent ZnO thin films were deposited on glass substrates by using a simple and inexpensive multi-step sol–gel spin coating process. This research investigated the effects of annealing temperature in the range from 350–600°C on the microstructure, surface morphology and optical properties of thin films by using XRD, SEM and transmittance spectra. The XRD results showed that the c-axis orientation of ZnO thin films was improved with the increase of annealing temperature. The grain size increases from 16.6–19.7 nm with the increase in temperature. The transmittance spectra indicated that the transmittance and direct optical band gap Eg of the films showed a decreased trend with annealing temperature. It is found that the tensile stress exist in the films, which decreases with the increase in annealing temperature up to 500°C, on further increasing the annealing temperature up to 600°C, the stress in the film changes from tensile to compressive nature.

Influence of Annealing Temperature on ZnO Thin Films Prepared by Single and Multi-step Sol-gel Processes

2006 ◽  
Vol 957 ◽  
Author(s):  
Lee Huat Kelly Koh ◽  
Shane O'Brien ◽  
Pierre Lovera ◽  
Gareth Redmond ◽  
Gabriel M Crean
Keyword(s):  
Thin Films ◽  
Zinc Acetate ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Single Layer ◽  
Single Step ◽  
Zno Thin Films ◽  
Visible Range ◽  
Zno Films ◽  
Axis Orientation

ABSTRACTZnO thin films were prepared on borosilicate glass from both single- and multi- step coating deposition of a sol-gel prepared with anhydrous zinc acetate [Zn(C2H3O2)2], monoethanolamine [H2NC2H4OH ] and isopropanol. ZnO films prepared over a range of zinc acetate concentrations, for a fixed annealing temperature, showed that sol-gels prepared with a 0.3M zinc acetate concentration resulted in the formation of films with the greatest degree of c-axis orientation. In this study, a detailed investigation of the influence of process annealing temperature over the range 450 – 550°C on the microstructural, physical, electronic and optical properties of these single and multi-step ZnO thin films around this 0.3M zinc concentration set point is presented. X-ray analysis showed that all single-step deposition thin films were preferentially orientated along the [002] c-axis direction of the crystal. In contrast, only the multi-layer film annealed at 550°C showed similar preferential orientation. All single step deposited films showed a similar average optical transmittance above 87%, independent of annealing temperature. The transmittance of the multi-step films was shown to be strongly correlated to the degree of c-axis orientation. The optical band-gap energy was evaluated to be 3.298 – 3.316 eV for all samples. The photoluminescence spectra of the single layer ZnO films showed a strong emission centred at ca. 405 nm, which blue shifted with increasing annealing temperature. The multi-layer ZnO samples emitted throughout the UV and the visible range, with the samples prepared at 500 and 550°C showing the expected ZnO emission peak at 380 nm. Despite being thicker, the emission from the multi- layer samples was less than measured for the single layer samples. The effect of sol-gel annealing temperature and deposition process on film microstructure, morphology, electrical resistivity and optical transparency is detailed.

Structural, Optical and Magnetic Properties of Nanocrystalline Co-Doped ZnO Thin Films Grown by Sol–Gel

2017 ◽  
Vol 73 (1) ◽  
pp. 13-21 ◽  
Author(s):  
Zohra Nazir Kayani ◽  
Iqra Shah ◽  
Bareera Zulfiqar ◽  
Saira Riaz ◽  
Shahzad Naseem ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Sol Gel ◽  
Hexagonal Wurtzite Structure ◽  
Magnetic Surface ◽  
Zno Thin Films ◽  
Zno Films ◽  
X Ray Diffraction ◽  
Doped Zno ◽  
Co Doped

AbstractCobalt-doped ZnO thin films have been deposited using a sol–gel route by changing the number of coats on the substrate from 6 to 18. This project deals with various film thicknesses by increasing the number of deposited coats. The effect of thickness on structural, magnetic, surface morphology and optical properties of Co-doped ZnO thin film was studied. The crystal structure of the Co-doped ZnO films was investigated by X-ray diffraction. The films have polycrystalline wurtzite hexagonal structures. A Co2+ ion takes the place of a Zn2+ ion in the lattice without creating any distortion in its hexagonal wurtzite structure. An examination of the optical transmission spectra showed that the energy band gap of the Co-doped ZnO films increased from 3.87 to 3.97 eV with an increase in the number of coatings on the substrate. Ferromagnetic behaviour was confirmed by measurements using a vibrating sample magnetometer. The surface morphology of thin films was assessed by scanning electron microscope. The grain size on the surface of thin films increased with an increase in the number of coats.

scholarly journals Effects of Low Ag Doping on Physical and Optical Waveguide Properties of Highly Oriented Sol-Gel ZnO Thin Films

2015 ◽  
Vol 2015 ◽  
pp. 1-10 ◽  
Author(s):  
Mohamed Dehimi ◽  
Tahar Touam ◽  
Azeddine Chelouche ◽  
Fares Boudjouan ◽  
Djamel Djouadi ◽  
...  
Keyword(s):  
Thin Films ◽  
Doping Concentration ◽  
Sol Gel ◽  
Polarized Light ◽  
Hexagonal Wurtzite Structure ◽  
Xrd Analysis ◽  
Dip Coating ◽  
Planar Waveguides ◽  
Zno Thin Films ◽  
Ag Doping

A sol-gel dip-coating process was used to deposit almost stress-free highlyc-axis oriented zinc oxide (ZnO) thin films onto glass substrates. The effects of low silver doping concentration (Ag/Zn < 1%) on the structural, morphological, optical, and waveguide properties of such films were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy, UV-Visible spectrophotometry, and M-lines spectroscopy (MLS). XRD analysis revealed that all the films were in single phase and had a hexagonal wurtzite structure. The grain size values were calculated and found to be about 24–29 nm. SEM micrographs and AFM images have shown that film morphology and surface roughness were influenced by Ag doping concentration. According to UV-Vis. measurements all the films were highly transparent with average visible transmission values ranging from 80% to 86%. It was found that the Ag contents lead to widening of the band gap. MLS measurements at 632.8 nm wavelength put into evidence that all thin film planar waveguides demonstrate a well-guided fundamental mode for both transverse electric and transverse magnetic polarized light. Moreover, the refractive index of ZnO thin films was found to increase by Ag doping levels.

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