Characterization of Glass-Ceramics by TEM
The characterization technique of glass-ceramics by TEM was discussed by comparing the effects of single layer carbon film technique and double layers carbon film technique on the microstructure of Li-Al-Si glass-ceramics. The results show that double layers carbon film technique can improve glass-ceramics sample’s conductivity, reduce the induction of elctron beam on glass-ceramics, and avoid the temperature increasing of glass-ceramics particles caused by the charges aggregation on the particles’ surface when TEM electron beam hit down, prevent glass-ceramics from crystallization and the transformation of microstructurec. So, compared with single layer carbon film technique, double layers carbon film technique is more suitable for the research of microsture of glass-ceramics by TEM.