Dewetting Suppression of Polystyrene Thin Film Using Titanium Dioxide Nanoparticles

2014 ◽  
Vol 608 ◽  
pp. 218-223 ◽  
Author(s):  
Nampueng Pangpaiboon ◽  
Nisanart Traiphol

Effects of titanium dioxide nanoparticles on thermal stability of polymeric thin film are investigated in this study. Polystyrene with molecular weight of 52,000 g/mol is used as a base polymer. The concentrations of titanium dioxide nanoparticles in polystyrene are varied from 0-0.20 wt.%. Films are fabricated by spin casting on Si wafer substrate and annealed at 180 °C and 190 °C for various times in order to study dynamics of dewetting. Film morphologies are analysed by optical microscopy and atomic force microscopy. Dewetting areas of each film as a function of annealing time are determined. It is found that addition of titanium dioxide nanoparticles suppresses dewetting in polystyrene film with thicknesses of ~30 nm and ~100 nm. The same titanium dioxide amounts, on the other hand, accelerate dewetting process in the film with thickness of ~265 nm. Mechanisms of dewetting suppression in polymeric film by titanium dioxide nanoparticles are discussed.

2020 ◽  
Vol 58 (3) ◽  
pp. 207-215
Author(s):  
Young-Joon Kang ◽  
Ju-Hwan Baeg ◽  
Hyun Park ◽  
Young-Rae Cho

Materials with very small dimensions exhibit different physical and mechanical properties compared to their bulk counterparts. This becomes significantly important for the thin films that are widely used as components in micro-electronics and functional materials. In this study, a chromium (Cr) thin film was deposited on a silicon (Si) wafer by DC-magnetron sputtering. The intrinsic hardness of the Cr thin film on Si-wafer was evaluated by the nanoindentation method. We especially investigated ways of measuring the intrinsic hardness of the Cr thin film, and influential factors including the substrate effect and surface roughness effect. To further characterize the intrinsic hardness of the Cr thin film on Si-wafer, we used Xray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Two additional methods, the Meyer-plot and a profile for hardness versus indentation depth, were also employed. As a result of these two methods, we found that the profile for hardness versus indentation depth was valuable for evaluating the intrinsic hardness of Cr thin film on a Si-wafer substrate. The measured intrinsic hardness of the Cr thin film and Si wafer were about 900 Hv and 1143 Hv, respectively. The profile for hardness versus indentation depth can be widely used to evaluate the intrinsic hardness of metallic thin films on substrates.


2019 ◽  
Vol 10 (2) ◽  
pp. 856-860 ◽  
Author(s):  
Swathi N ◽  
Sandhiya D ◽  
Rajeshkumar S ◽  
Lakshmi T

Green synthesis of titanium oxide nanoparticles has more advantages when compared with the chemical method. This work reports a green synthesis of titanium dioxide nanoparticles (TiO2NPs) by the herbal plant extracts of Cassia fistula. Then the green synthesized NPs were characterized by UV-Vis spectroscopy, X-ray Diffraction (XRD), Fourier transforms infra-Red spectroscopy (FT-IR), atomic force microscopy (AFM), scanning electron microscopy (SEM), thermogravimetric analysis (TGA). The result of the SEM image shows that the nanoparticles are spherical in shape. The antibacterial activity was done on Escherichia coli and Staphylococcus aureus.


2018 ◽  
Vol 25 (1) ◽  
pp. 40-50
Author(s):  
Basma Abbas Abdulmajeed ◽  
Sameera Hamadullah ◽  
Fadhil Abed Allawi

Ethanol as a solvent, a precursor of titanium isopropoxide and a stabilizer of either hydrochloric acid or ammonium hydroxide was used to prepare a titanium dioxide aqueous solution. The aqueous solutions with different values of pH and the morphology of the resultant reaction of the nanoparticles of titanium dioxide were investigated. The X-ray diffraction showed that at low temperatures and with acidic solutions, rutile structures are more favorable to grow on titanium dioxide synthesized, while at low and average temperatures and with base solutions, anatase phase is more pronounced. The crystalline form and the re-confirmation of the crystallite size growth were observed by the scanning electron microscopy. The atomic force microscopy was used to confirm the relation between the roughness and thickness with the pH level.  


2011 ◽  
Vol 14 (8) ◽  
pp. H311 ◽  
Author(s):  
J. Y. Son ◽  
D.-Y. Kim ◽  
H. Kim ◽  
W. J. Maeng ◽  
Y.-S. Shin ◽  
...  

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