Crystallization Kinetics of Fe-B Based Amorphous Alloys Studied In Situ by X-Ray Diffraction and Differential Scanning Calorimetry

2004 ◽  
Vol 453-454 ◽  
pp. 375-380
Author(s):  
P. Tomić ◽  
M. Davidović ◽  
S. Batinić
2011 ◽  
Vol 172-174 ◽  
pp. 646-651 ◽  
Author(s):  
Gamra Tellouche ◽  
Khalid Hoummada ◽  
Dominique Mangelinck ◽  
Ivan Blum

The phase formation sequence of Ni silicide for different thicknesses is studied by in situ X ray diffraction and differential scanning calorimetry measurements. The formation of a transient phase is observed during the formation of δ-Ni2Si; transient phases grow and disappear during the growth of another phase. A possible mechanism is proposed for the transient phase formation and consumption. It is applied to the growth and consumption of θ-Ni2Si. A good accordance is found between the proposed model and in situ measurement of the kinetics of phase formation obtained by x-ray diffraction and differential scanning calorimetry for higher thickness.


2018 ◽  
Vol 18 (5) ◽  
pp. 3107-3116 ◽  
Author(s):  
Eva Gil-González ◽  
Antonio Perejón ◽  
Pedro E. Sánchez-Jiménez ◽  
Santiago Medina-Carrasco ◽  
Jaroslav Kupčík ◽  
...  

CrystEngComm ◽  
2018 ◽  
Vol 20 (22) ◽  
pp. 3105-3116 ◽  
Author(s):  
Roman Svoboda ◽  
Roman Bulánek ◽  
Dušan Galusek ◽  
Roghayeh Hadidimasouleh ◽  
Yadolah Ganjkhanlou

Differential scanning calorimetry and in situ X-ray diffraction analysis were used to study the products and mechanism of crystal formation in VOx–ZrO2 ceramics.


2017 ◽  
Vol 19 (12) ◽  
pp. 8496-8503 ◽  
Author(s):  
Nicolas Boulanger ◽  
Victor Yu ◽  
Michael Hilke ◽  
Michael F. Toney ◽  
David R. Barbero

In situ X-ray diffraction analysis of P3HT films during cooling down on both Si and G.


2004 ◽  
Vol 108 (34) ◽  
pp. 12698-12706 ◽  
Author(s):  
Bradley L. Kirsch ◽  
Erik K. Richman ◽  
Andrew E. Riley ◽  
Sarah H. Tolbert

1999 ◽  
Vol 562 ◽  
Author(s):  
J. P. Lokker ◽  
A. J. Bottger ◽  
G. C. A. M. Janssen ◽  
S. Radelaar

ABSTRACTThe precipitate formation occurring in Al-Cu thin foils with copper concentrations of either 1.15 at.% or 0.3 at.%, has been studied. In-situ X-ray diffraction analysis and differential scanning calorimetry are applied to determine the phases formed and the enthalpy changes in the same samples. Both X-ray diffraction and differential scanning calorimetry indicate that the precipitation behaviour of thin films (about 500 nm thickness) differs significantly from that of bulk material. In the films studied the precipitation of Al2Cu occurs at a much lower temperature than expected on the basis of the (bulk) phase diagram. Moreover, no intermediate phases are observed prior to Al2Cu precipitation. Also the amount of Cu in solid solution (0.20 at%Cu) observed by electron-probe micro-analysis after slowly cooling from 500°C to room temperature, exceeds the solubility of bulk Al-Cu.


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