scholarly journals System-on-Chip Test Data Compression Based on Split-Data Variable Length (SDV) Code

2016 ◽  
Vol 07 (08) ◽  
pp. 1213-1223
Author(s):  
J. Robert Theivadas ◽  
V. Ranganathan ◽  
J. Raja Paul Perinbam
Keyword(s):  
Data Compression ◽  
Test Data ◽  
System On Chip ◽  
Variable Length ◽  
Test Data Compression ◽  
On Chip

Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding

2016 ◽  
Vol 32 (5) ◽  
pp. 639-647
Author(s):  
Haiying Yuan ◽  
Zijian Ju ◽  
Xun Sun ◽  
Kun Guo ◽  
Xiuyu Wang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
System On Chip ◽  
Test Data Compression ◽  
On Chip

Test data compression of system-on-chip (SoC) using few relevant bits

2013 ◽  
Vol 27 (1) ◽  
pp. 76-82 ◽  
Author(s):  
Yiming Ouyang ◽  
Guilin Huang ◽  
Huaguo Liang ◽  
Tao Xie ◽  
Zhengfeng Huang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
System On Chip ◽  
Test Data Compression ◽  
On Chip

Thermal-aware Test Data Compression for System-on-Chip Based on Modified Bitmask Based Methods

2020 ◽  
Vol 36 (5) ◽  
pp. 577-590
Author(s):  
Azhaganantham Arulmurugan ◽  
Govindasamy Murugesan ◽  
Balasubramaniam Vivek
Keyword(s):  
Data Compression ◽  
Test Data ◽  
System On Chip ◽  
Test Data Compression ◽  
On Chip

A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding

2009 ◽  
Vol 31 (10) ◽  
pp. 1826-1834 ◽  
Author(s):  
Wen-Fa ZHAN ◽  
Hua-Guo LIANG ◽  
Feng SHI ◽  
Zheng-Feng HUANG
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Variable Length ◽  
Test Data Compression ◽  
Compression Scheme ◽  
Variable Length Coding
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