scholarly journals Error Correction Circuit for Single-Event Hardening of Delay Locked Loops

2016 ◽  
Vol 07 (09) ◽  
pp. 2437-2442 ◽  
Author(s):  
S. Balaji ◽  
S. Ramasamy
Keyword(s):  
Error Correction ◽  
Single Event ◽  
Delay Locked Loops

scholarly journals Error Detection and Correction On-Board Nanosatellites Using Hamming Codes

2019 ◽  
Vol 2019 ◽  
pp. 1-15 ◽  
Author(s):  
Caleb Hillier ◽  
Vipin Balyan
Keyword(s):  
Error Correction ◽  
Error Detection ◽  
Simulation Software ◽  
Hamming Code ◽  
Single Event ◽  
Hamming Codes ◽  
Single Event Effects ◽  
Effective Version ◽  
Fast Speed ◽  
Error Detection And Correction

The field of nanosatellites is constantly evolving and growing at a very fast speed. This creates a growing demand for more advanced and reliable EDAC systems that are capable of protecting all memory aspects of satellites. The Hamming code was identified as a suitable EDAC scheme for the prevention of single event effects on-board a nanosatellite in LEO. In this paper, three variations of Hamming codes are tested both in Matlab and VHDL. The most effective version was Hamming [16, 11, 4]2. This code guarantees single-error correction and double-error detection. All developed Hamming codes are suited for FPGA implementation, for which they are tested thoroughly using simulation software and optimized.

A New Error Correction Circuit for Delay Locked Loops

2013 ◽  
Vol 60 (6) ◽  
pp. 4387-4393 ◽  
Author(s):  
Pierre Maillard ◽  
W. Timothy Holman ◽  
T. Daniel Loveless ◽  
Lloyd W. Massengill
Keyword(s):  
Error Correction ◽  
Delay Locked Loops

Single-Event Upset (SEU) in a Dram with On-Chip Error Correction

1987 ◽  
Vol 34 (6) ◽  
pp. 1310-1315 ◽  
Author(s):  
J. A. Zoutendyk ◽  
H. R. Schwartz ◽  
R. K. Watson ◽  
Z. Hasnain ◽  
L. R. Nevill
Keyword(s):  
Error Correction ◽  
Single Event Upset ◽  
Single Event ◽  
On Chip

An Error Correction Code for Use in Space Vehicle Computers

2011 ◽  
Vol 121-126 ◽  
pp. 3784-3788
Author(s):  
R.N. Huang ◽  
B. Gong ◽  
Yun Jiang Lou
Keyword(s):  
Error Correction ◽  
Error Detection ◽  
Efficient Solution ◽  
Space Vehicle ◽  
Space Vehicles ◽  
Memory Cells ◽  
Hamming Code ◽  
Single Event Upset ◽  
Single Event ◽  
Signal Error

Memory cells of space vehicle computers generate errors in their stored data because of radiation. The main reason of the error is single event upset (SEU). Hamming code which has Capability of correcting one bit and detecting two bits is usually used in space vehicles to secure the memory data. As the density of the memory is more and more high, the possibility of multiple bits upset (MBU) increase and hamming code may be inadequate. In this paper, a (15,8) code is presented which can correct all double-adjacent errors and triple-adjacent errors in addition to signal error correction (SEC) and double error detection (DED). It is a powerful and efficient solution to SEU and MBU.

scholarly journals Multi-class Classification Method of Support Vector Machine Based on Error Correction Coding

2021 ◽  
Author(s):  
Li Junfei ◽  
Zhao Longhai
Keyword(s):  
Support Vector Machine ◽  
Error Correction ◽  
Classification Method ◽  
Radiation Environment ◽  
Support Vector ◽  
Single Event ◽  
Error Correction Coding ◽  
Multi Class Classification ◽  
Multi Classification ◽  
Space Radiation Environment

Abstract In the space radiation environment, there will be many errors in the multi-classification results of support vector machine which caused by single event flipping , the ability of correcting classification errors through error correction coding is studied in this paper, results of simulation confirm that error correction coding can increase the accuracy ,which is beneficial for anti-single event flip.

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