scholarly journals Polycrystalline Silicon Solar Cell p-n Junction Capacitance Behavior Modelling under an Integrated External Electrical Field Source in Solar Cell System

2020 ◽  
Vol 12 (05) ◽  
pp. 143-153
Author(s):  
Adama Ouedraogo ◽  
Boukaré Ouedraogo ◽  
Boureima Kaboré ◽  
Dieudonné Joseph Bathiebo
2019 ◽  
Vol 44 (7) ◽  
pp. 6651-6657
Author(s):  
Adama Ouedraogo ◽  
Thierry Sikoudouin Maurice Ky ◽  
Abdoulaye Compaore ◽  
Dieudonné Joseph Bathiebo

2019 ◽  
Vol 31 (3) ◽  
pp. 2308-2319 ◽  
Author(s):  
Gobinath Velu Kaliyannan ◽  
Senthil Velmurugan Palanisamy ◽  
Rajasekar Rathanasamy ◽  
Manivasakan Palanisamy ◽  
Sathish Kumar Palaniappan ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (111) ◽  
pp. 110409-110415 ◽  
Author(s):  
Jin Dong ◽  
Baoping Lin

Modified SiO2 was doped into an EVA film containing a Eu3+ complex and the results show that the fluorescence of the EVA composite film increased, which helped to improve the photoelectric conversion efficiency of the solar cell.


2012 ◽  
Vol 5 (11) ◽  
pp. 112301 ◽  
Author(s):  
Hidetoshi Nakanishi ◽  
Shogo Fujiwara ◽  
Kazuhisa Takayama ◽  
Iwao Kawayama ◽  
Hironaru Murakami ◽  
...  

2007 ◽  
Vol 43 (4) ◽  
pp. 203-206 ◽  
Author(s):  
M. S. Saidov ◽  
B. M. Abdurakhmanov ◽  
L. O. Olimov

2014 ◽  
Vol 548-549 ◽  
pp. 48-52 ◽  
Author(s):  
Han Wang ◽  
Rui Miao ◽  
Xiao Song Wu ◽  
Wang Yuan Ni ◽  
Xu Chen Tang

As non-uniform color and complex texture exist on the polycrystalline silicon solar cell, manual surface inspection adopted by most domestic factories suffers from low efficiency and poor repetitive detection ability. To overcome the shortcomings of manual inspection, based on machine vision and SVM, an automatic silicon wafer surface defect detection and classification system has been developed in this paper: through feature extraction of color images and defect areas, a series of wafer classifiers are trained and used to separate the defective products from qualified ones. Experiments on samples and actual application in the enterprise show that the system has achieved high accuracy and fast run-time performance, indicating that machine vision is an effective and promising method for polycrystalline silicon solar cell inspection.


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