Beyond Medicines Supply: Evaluation of Value-added Community Pharmacist’s Services in Libya: Cross Sectional Analysis

2021 ◽  
Vol 3 (1) ◽  
pp. 22-27
Author(s):  
Shukri M. Alsharif ◽  
Abdurraouf M. Khalaf ◽  
Hajer M. Arajabi ◽  
Saadoun O. Elmezughi ◽  
Fathi M. Sherif
2019 ◽  
Vol 4 (2) ◽  
pp. 295-311
Author(s):  
Muhammad Yunus

This research was aimed at analysis the performance of Cements Company which listed at BEI, using conventional methods that Economic Value Added (EVA) approach. This research is quantitative descriptive study using secondary data that the financial statements in the period 2016-2019 of Cement Companies listed on the Stock Exchange, this study uses analysis tools such as descriptive analysis, time series analysis, and cross-sectional analysis approach. The results of this study are cements company performance as measured Economic Value Added (EVA) Approach produces a positive value, with growth in Economic Value Added (EVA) every year for each of the cement companies are fluctuative. In cross sectional analysis approach SMGR achieve that the highest average value of EVA afford obtained by INTP, each by 28 percent, Rp973 and Rp3, 326.919.


2012 ◽  
Vol 58 (4) ◽  
pp. 472-476 ◽  
Author(s):  
Caroline Filla Rosaneli ◽  
Flavia Auler ◽  
Carla Barreto Manfrinato ◽  
Claudine Filla Rosaneli ◽  
Caroline Sganzerla ◽  
...  

2017 ◽  
Vol 48 (S 01) ◽  
pp. S1-S45
Author(s):  
M. Zielonka ◽  
S. Garbade ◽  
S. Kölker ◽  
G. Hoffmann ◽  
M. Ries

2019 ◽  
Author(s):  
Patricia Clark ◽  
Annarella Barbato ◽  
Miguel Angel Guagnelli ◽  
Jose Alberto Rascon ◽  
Edgar Denova ◽  
...  

Diabetes ◽  
2020 ◽  
Vol 69 (Supplement 1) ◽  
pp. 2174-PUB
Author(s):  
NARAYANAN NK ◽  
CS DWARAKANATH ◽  
VENKATARAMAN S ◽  
MANIKANDAN RM ◽  
NARENDRA BS ◽  
...  

Author(s):  
B. Domengès ◽  
P. Poirier

Abstract In this study, the resistance of FIB prepared vias was characterized by the Kelvin probe technique and their physical characteristics studied using cross-sectional analysis. Two domains of resistivity were isolated in relation to the ion beam current used for the deposition of the via metal (Pt). Also submicrometer vias were investigated on 4.2 µm deep metal lines of a BiCMOS aluminum based design and a CMOS 090 copper based one. It is shown that the controlling parameter is the shape and volume of the contact, and that the contact formation is favored by the amount of over-mill of the via into the metal line it will contact.


2019 ◽  
Author(s):  
Yanink Caro-Vega ◽  
Pablo F. Belaunzarán-Zamudio ◽  
Jesús Alegre-Díaz ◽  
Brenda Crabtree-Ramírez ◽  
Raúl Ramírez-Reyes ◽  
...  

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