Snapshot Angle-Resolved Spectroscopy and Its Application for Study of Highly Efficient Polariton OLEDs

The multifunctional snapshot angle-resolved spectroscopy (ARS) system capable of electroluminescence, photoluminescence, and reflectance measurements for thin film devices is developed based on the k-space imaging technique. Compared with the conventional goniometric ARS system, this snapshot spectroscopy system offers great advantages of rapid and simple measurement, suitable for characterizing thin film devices that are unstable or degraded under long-time or high-power driving conditions, such as OLEDs. We perform a detailed calibration of the snapshot system and show that the measured results closely match with those obtained using a goniometric system. Furthermore, we show the capabilities of the system with application in studying polariton OLEDs. The result provides comprehensive information on the polariton mode dispersion and emission distribution, and shows an effective radiative pumping of the lower polariton branch for high emission efficiency.

Absence of evidence of superconductivity in sulfur hydride in optical reflectance experiments

Capitani and coworkers reported that infrared optical reflectance measurements provided evidence for a superconducting transition in sulfur hydride under 150 GPa pressure, and that the transition is driven by the electron-phonon interaction. Here we argue that the measured data did not provide evidence that the system undergoes a transition to a superconducting state, nor do the data support any role of phonons in driving a transition. Rather, the data are consistent with the system remaining in the normal state down to temperature 50K, the lowest temperature measured in the experiment. This calls into further question the generally accepted view that sulfur hydride under pressure is a high temperature superconductor.

Calculation of Spectral Optical Constants Using Combined Ellipsometric and Reflectance Methods for Smooth and Rough Bulk Samples

Spectra of the optical constants n and k of a substance are often deduced from spectroscopic measurements, performed on a thick and homogeneous sample, and from a model used to simulate these measurements. Spectra obtained for n and k using the ellipsometric method generally produce polarized reflectance simulations in strong agreement with the experimental measurements, but they sometimes introduce significant discrepancies over limited spectral ranges, whereas spectra of n and k obtained with the single-angle reflectance method require a perfectly smooth sample surface to be viable. This paper presents an alternative method to calculate n and k. The method exploits both ellipsometric measurements and s-polarized specular reflectance measurements, and compensates for potential surface scattering effects with the introduction of a specularity factor. It is applicable to bulk samples having either a smooth or a rough surface. It provides spectral optical constants that are consistent with s-polarized reflectance measurements. Demonstrations are performed in the infrared region using a glass slide (smooth surface) and a pellet of compressed ammonium sulfate powder (rough surface).

Reflectance Measurements on Cultural Heritage

Cultural heritage is a valuable and characteristic symbol of every country. It should be handled with care and it must be exhaustively investigated and measured with non-destructive techniques. In this chapter, we will talk about different reflectance measurement techniques to obtain the conservation state of the artwork. With this reflectance characterization, conservators, and curators could soon determine the best maintenance procedures for restoration purposes. Also, a new technique for lighting will be discussed, where the artwork can be also photonically restored illuminating with the correct light in the desired area of the artwork using a spectrally selective projection system.

Borocarbonitride Layers on Titanium Dioxide Nanoribbons for Efficient Photoelectrocatalytic Water Splitting

Heterostructures formed by ultrathin borocarbonitride (BCN) layers grown on TiO2 nanoribbons were investigated as photoanodes for photoelectrochemical water splitting. TiO2 nanoribbons were obtained by thermal oxidation of TiS3 samples. Then, BCN layers were successfully grown by plasma enhanced chemical vapour deposition. The structure and the chemical composition of the starting TiS3, the TiO2 nanoribbons and the TiO2-BCN heterostructures were investigated by Raman spectroscopy, X-ray diffraction and X-ray photoelectron spectroscopy. Diffuse reflectance measurements showed a change in the gap from 0.94 eV (TiS3) to 3.3 eV (TiO2) after the thermal annealing of the starting material. Morphological characterizations, such as scanning electron microscopy and optical microscopy, show that the morphology of the samples was not affected by the change in the structure and composition. The obtained TiO2-BCN heterostructures were measured in a photoelectrochemical cell, showing an enhanced density of current under dark conditions and higher photocurrents when compared with TiO2. Finally, using electrochemical impedance spectroscopy, the flat band potential was determined to be equal in both TiO2 and TiO2-BCN samples, whereas the product of the dielectric constant and the density of donors was higher for TiO2-BCN.