2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
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Published By IEEE

9781467311885, 9781467311878, 9781467311861

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

On-chip aging sensor to monitor NBTI effect in nano-scale SRAM

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219087 ◽

2012 ◽

Cited By ~ 8

Author(s):

A. Ceratti ◽

T. Copetti ◽

L. Bolzani ◽

F. Vargas

Keyword(s):

Nano Scale ◽

On Chip

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Design techniques for increasing performance and resource utilization of reconfigurable soft CPUs

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219024 ◽

2012 ◽

Cited By ~ 2

Author(s):

Alexander Wold ◽

Dirk Koch ◽

Jim Torresen

Keyword(s):

Resource Utilization ◽

Design Techniques

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A new SAT-based ATPG for generating highly compacted test sets

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219063 ◽

2012 ◽

Cited By ~ 11

Author(s):

Stephan Eggersglu ◽

Rene Krenz-Baath ◽

Andreas Glowatz ◽

Friedrich Hapke ◽

Rolf Drechsler

Keyword(s):

Test Sets

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A low voltage sigma delta modulator for temperature sensor

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219072 ◽

2012 ◽

Author(s):

Yi-Hsiang Juan ◽

Ching-hsing Luo ◽

Hong-Yi Huang

Keyword(s):

Temperature Sensor ◽

Low Voltage ◽

Sigma Delta Modulator ◽

Sigma Delta

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Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219089 ◽

2012 ◽

Cited By ~ 7

Author(s):

A. N. M. Alahmadi ◽

G. Russell ◽

A. Yakovlev

Keyword(s):

Time Difference ◽

Time Interval ◽

Measurement Circuit ◽

Interval Measurement ◽

Time Interval Measurement ◽

Programmable Gain

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IEEE Computer Society TTTC: Test Technology Technical Council

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219096 ◽

2012 ◽

Keyword(s):

Technical Council ◽

Ieee Computer Society ◽

Test Technology

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The architecture and the technology characterization of an FPGA-based customizable Application-Specific Vector Processor

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219026 ◽

2012 ◽

Cited By ~ 3

Author(s):

Jaroslav Sykora ◽

Lukas Kohout ◽

Roman Bartosinski ◽

Leos Kafka ◽

Martin Danek ◽

...

Keyword(s):

Vector Processor ◽

Application Specific

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On-line test of embedded systems: Which role for functional test?

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219007 ◽

2012 ◽

Author(s):

Matteo Sonza Reorda

Keyword(s):

Embedded Systems ◽

Functional Test ◽

On Line ◽

Line Test

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BTI impact on logical gates in nano-scale CMOS technology

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219086 ◽

2012 ◽

Cited By ~ 16

Author(s):

Seyab Khan ◽

Said Hamdioui ◽

Halil Kukner ◽

Praveen Raghavan ◽

Francky Catthoor

Keyword(s):

Cmos Technology ◽

Nano Scale

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Combining on-line fault detection and logic self repair

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ◽

10.1109/ddecs.2012.6219076 ◽

2012 ◽

Cited By ~ 3

Author(s):

Tobias Koal ◽

Markus Ulbricht ◽

Heinrich T. Vierhaus

Keyword(s):

Fault Detection ◽

On Line ◽

Self Repair

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2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

On-chip aging sensor to monitor NBTI effect in nano-scale SRAM

Design techniques for increasing performance and resource utilization of reconfigurable soft CPUs

A new SAT-based ATPG for generating highly compacted test sets

A low voltage sigma delta modulator for temperature sensor

Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier

IEEE Computer Society TTTC: Test Technology Technical Council

The architecture and the technology characterization of an FPGA-based customizable Application-Specific Vector Processor

On-line test of embedded systems: Which role for functional test?

BTI impact on logical gates in nano-scale CMOS technology

Combining on-line fault detection and logic self repair

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Latest Publications