2006 IEEE Radiation Effects Data Workshop
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

SEE and TID Results for a RadHard-by-Design 16Mbit SRAM with Embedded EDAC

2006 ◽  
Author(s):  
C. Hafer ◽  
J. Mabra ◽  
D. Slocum ◽  
T. Farris ◽  
A. Jordan

The Effects of Proton Irradiation on 90 nm Strained Si CMOS on SOI Devices

2006 ◽  
Author(s):  
Aravind Appaswamy ◽  
Bongim Jun ◽  
Ryan Diestelhorst ◽  
Gustavo Espinel ◽  
A.P. Prakash ◽  
...  
Keyword(s):  
Proton Irradiation ◽  
Strained Si ◽  
Soi Devices

Correlating Geometry and Shielding Effects on Accelerated Soft Errors in 90nm SRAM Using Spallation Neutron Beams

2006 ◽  
Author(s):  
Xiaowei Zhu ◽  
Rob Baumann ◽  
Bruce Takala ◽  
Dwayne Dohmann ◽  
Larry Martinez
Keyword(s):  
Soft Errors ◽  
Neutron Beams ◽  
Shielding Effects

Single Event Effects Sensitivity of the Q Series Advanced CMOS Technology

2006 ◽  
Author(s):  
R. Koga ◽  
J. George ◽  
P. Yu ◽  
S. Crain ◽  
M. Zakrzewski ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Single Event ◽  
Single Event Effects

Effects of Radiation on Commercial Power Devices

2006 ◽  
Author(s):  
Luis Selva ◽  
Heidi Becker ◽  
Rosa Chavez ◽  
Leif Scheick
Keyword(s):  
Power Devices ◽  
Effects Of Radiation

Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35¿m Triple-Well Process

2006 ◽  
Author(s):  
Mary Hartwell ◽  
Kevin Ryan ◽  
Steve Netherton ◽  
Peter Milliken ◽  
David Kerwin
Keyword(s):  
Total Ionizing Dose

Radiation Tests on 2Gb NAND Flash Memories

2006 ◽  
Author(s):  
D.n. Nguyen ◽  
S. Guertin ◽  
J. Patterson
Keyword(s):  
Nand Flash ◽  
Flash Memories

Compendia of Radiation Test Results of Integrated Circuits

2006 ◽  
Author(s):  
Phil Layton ◽  
Charlie Gilbert ◽  
Ed Patnaude ◽  
Gale Williamson ◽  
Larry Longden ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Test Results ◽  
Radiation Test
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