2020 IEEE International Test Conference (ITC)
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9781728191133
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Logic Fault Diagnosis of Hidden Delay Defects

2020 ◽  
Author(s):  
Stefan Holst ◽  
Matthias Kampmann ◽  
Alexander Sprenger ◽  
Jan Dennis Reimer ◽  
Sybille Hellebrand ◽  
...  
Keyword(s):  
Fault Diagnosis ◽  
Delay Defects

Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks

2020 ◽  
Author(s):  
Natalia Lylina ◽  
Ahmed Atteya ◽  
Chih-Hao Wang ◽  
Hans-Joachim Wunderlich

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs

2020 ◽  
Author(s):  
Stephen Sunter ◽  
Michal Wolinski ◽  
Anthony Coyette ◽  
Ronny Vanhooren ◽  
Wim Dobbelaere ◽  
...  
Keyword(s):  
Functional Safety ◽  
Mixed Signal

Fail Memory Configuration Set for RA Estimation

2020 ◽  
Author(s):  
Hayoung Lee ◽  
Keewon Cho ◽  
Sungho Kang ◽  
Wooheon Kang ◽  
Seungtaek Lee ◽  
...  
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