2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop
Latest Publications

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9781467319256, 9780769547268

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

DSP Driven Parallel EVM Testing of Embedded MIMO-OFDM RF Modules

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.18 ◽

2012 ◽

Cited By ~ 2

Author(s):

S. Devarakond ◽

D. Banerjee ◽

A. Banerjee ◽

S. Sen ◽

A. Chatterjee

Keyword(s):

Mimo Ofdm

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Ternary Stimulus for Fully Digital Dynamic Testing of SC S? ADCs

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.12 ◽

2012 ◽

Cited By ~ 4

Author(s):

Matthieu Dubois ◽

Haralampos G. Stratigopoulos ◽

Salvador Mir

Keyword(s):

Dynamic Testing

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Panel

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.9 ◽

2012 ◽

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Determining of Magnetic Resonance Forces on a MEMS Cantilever in a Fusarium Graminearum Spore Detector

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.30 ◽

2012 ◽

Author(s):

Mike Rowe ◽

Anh Dinh

Keyword(s):

Magnetic Resonance ◽

Fusarium Graminearum

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Digital Modulation/Demodulation Measurement System within Connected Solution

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.20 ◽

2012 ◽

Author(s):

Sy-Haur Su ◽

Shuw-Guann Lin ◽

Hsu-Feng Hsiao ◽

Da-Chiang Chang ◽

Hwann-Kaeo Chiou

Keyword(s):

Measurement System ◽

Digital Modulation

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Trading Off Test Coverage and False Reject Risk of Self-Calibrating Self-Test Systems

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.32 ◽

2012 ◽

Author(s):

Hans Martin von Staudt ◽

Frank Schwiderski

Keyword(s):

Test Coverage ◽

Test Systems ◽

Self Test

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Welcome message

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.5 ◽

2012 ◽

Author(s):

Cheng-wen Wu ◽

Jiun-Lang Huang

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Estimating Total-Harmonic-Distortion of Analog Signal in Time-Domain

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.28 ◽

2012 ◽

Cited By ~ 1

Author(s):

Chun Wei Lin ◽

Shih Chung Luo

Keyword(s):

Time Domain ◽

Harmonic Distortion ◽

Total Harmonic Distortion ◽

Analog Signal

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[Publisher's information]

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.35 ◽

2012 ◽

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Author index

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop ◽

10.1109/ims3tw.2012.34 ◽

2012 ◽

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2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test WorkshopLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

DSP Driven Parallel EVM Testing of Embedded MIMO-OFDM RF Modules

Ternary Stimulus for Fully Digital Dynamic Testing of SC S? ADCs

Panel

Determining of Magnetic Resonance Forces on a MEMS Cantilever in a Fusarium Graminearum Spore Detector

Digital Modulation/Demodulation Measurement System within Connected Solution

Trading Off Test Coverage and False Reject Risk of Self-Calibrating Self-Test Systems

Welcome message

Estimating Total-Harmonic-Distortion of Analog Signal in Time-Domain

[Publisher's information]

Author index

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop
Latest Publications