Semiconductor Laser Engineering, Reliability and Diagnostics
Latest Publications

TOTAL DOCUMENTS

14

(FIVE YEARS 0)

H-INDEX

1

(FIVE YEARS 0)

Published By John Wiley & Sons Ltd

9781118481882, 9781119990338

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Diode Laser Engineering

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.part1 ◽

2013 ◽

pp. 1-2

Keyword(s):

Diode Laser ◽

Laser Engineering

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Diode Laser Reliability

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.part2 ◽

2013 ◽

pp. 211-212

Keyword(s):

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Front Matter

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.fmatter ◽

2013 ◽

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Novel Diagnostic Data for Diverse Laser Temperature Effects; Dynamic Laser Degradation Effects; and Mirror Temperature Maps

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.ch9 ◽

2013 ◽

pp. 433-467

Keyword(s):

Temperature Effects ◽

Diagnostic Data ◽

Temperature Maps

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Novel Diagnostic Laser Data for Active Layer Material Integrity; Impurity Trapping Effects; and Mirror Temperatures

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.ch7 ◽

2013 ◽

pp. 361-408

Keyword(s):

Active Layer ◽

Layer Material ◽

Trapping Effects

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Novel Diagnostic Laser Data for Mirror Facet Disorder Effects; Mechanical Stress Effects; and Facet Coating Instability

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.ch8 ◽

2013 ◽

pp. 409-431

Keyword(s):

Mechanical Stress ◽

Disorder Effects ◽

Stress Effects ◽

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Diode Laser Reliability Engineering Program

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.ch6 ◽

2013 ◽

pp. 325-353

Keyword(s):

Diode Laser ◽

Reliability Engineering ◽

Engineering Program

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Design Considerations for High‐Power Single Spatial Mode Operation

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.ch2 ◽

2013 ◽

pp. 101-210

Keyword(s):

Spatial Mode ◽

Design Considerations ◽

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Optical Strength Engineering

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.ch4 ◽

2013 ◽

pp. 245-279

Keyword(s):

Optical Strength

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Index

Semiconductor Laser Engineering, Reliability and Diagnostics ◽

10.1002/9781118481882.index ◽

2013 ◽

pp. 469-496

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