Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)
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36

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Published By IEEE Comput. Soc

0769506461

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A stamping technique to increase the error correction capacity of the (127,k,d) RS code

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856632 ◽

2002 ◽

Author(s):

T. Vallino ◽

A. Dandache ◽

F. Monteiro ◽

B. Lepley ◽

J.P. Delahaye

Keyword(s):

Error Correction ◽

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A crosstalk sensor implementation for measuring interferences in digital CMOS VLSI circuits

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856611 ◽

2002 ◽

Author(s):

J.A. Sainz ◽

M. Roca ◽

R. Munoz ◽

J.A. Maiz ◽

L.A. Aguado

Keyword(s):

Vlsi Circuits ◽

Digital Cmos ◽

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New techniques for accelerating fault injection in VHDL descriptions

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856613 ◽

2002 ◽

Author(s):

B. Parrotta ◽

M. Rebaudengo ◽

M.S. Reorda ◽

M. Violante

Keyword(s):

Fault Injection ◽

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On-line current testing for a microprocessor based application with an off-chip sensor

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856617 ◽

2002 ◽

Author(s):

B. Alorda ◽

I. de Paul ◽

J. Segura ◽

T. Miller

Keyword(s):

Current Testing ◽

Line Current ◽

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An improved CMOS BICS for on-line testing

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856620 ◽

2002 ◽

Author(s):

Y. Maidon ◽

Y. Deval ◽

J.B. Begueret

Keyword(s):

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Faster time-to-market, lower cost of development and test for standard analog IC

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856630 ◽

2002 ◽

Author(s):

P. Migliavacca

Keyword(s):

Time To Market ◽

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Power reduction in test-per-scan BIST

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856625 ◽

2002 ◽

Author(s):

Xiaodong Zhang ◽

K. Roy

Keyword(s):

Power Reduction

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A study of the effects of transient fault injection into the VHDL model of a fault-tolerant microcomputer system

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856615 ◽

2002 ◽

Author(s):

D. Gil ◽

J. Gracia ◽

J.C. Baraza ◽

P.J. Gil

Keyword(s):

Fault Tolerant ◽

Fault Injection ◽

Microcomputer System ◽

Transient Fault

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Relation between fault tolerance and reconfiguration in cellular systems

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856607 ◽

2002 ◽

Author(s):

L. Sekanina ◽

V. Drabek

Keyword(s):

Fault Tolerance ◽

Cellular Systems

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Improving on-line BIST-based diagnosis for roving STARs

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) ◽

10.1109/olt.2000.856608 ◽

2002 ◽

Author(s):

M. Abramovici ◽

C. Stroud ◽

B. Skaggs ◽

J. Emmert

Keyword(s):

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