Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences
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Published By Springer Berlin Heidelberg

9783642087172, 9783662095188

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The Quest for Ultra-High Resolution

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_2 ◽

2001 ◽

pp. 35-79 ◽

Cited By ~ 1

Author(s):

J. M. Cowley

Keyword(s):

High Resolution

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Weak-Beam Electron Microscopy

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_8 ◽

2001 ◽

pp. 245-271

Author(s):

D. J. H. Cockayne

Keyword(s):

Electron Microscopy ◽

Beam Electron ◽

Weak Beam

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Quantitative Analysis of High-Resolution Atomic Images

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_5 ◽

2001 ◽

pp. 161-190

Author(s):

S. Q. Wang ◽

Y. M. Wang ◽

H. Q. Ye

Keyword(s):

Quantitative Analysis ◽

High Resolution

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Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_4 ◽

2001 ◽

pp. 113-159 ◽

Cited By ~ 1

Author(s):

Z. L. Wang

Keyword(s):

Electron Microscopy ◽

Inelastic Scattering

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Electron Amorphography

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_7 ◽

2001 ◽

pp. 223-243

Author(s):

Lu-Chang Qin

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Electron Crystallography-Structure Determination by Combining HREM, Crystallographic Image Processing and Electron Diffraction

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_6 ◽

2001 ◽

pp. 191-222 ◽

Cited By ~ 1

Author(s):

Xiaodong Zou ◽

Thomas E. Weirich ◽

Sven Hovmöller

Keyword(s):

Image Processing ◽

Electron Diffraction ◽

Structure Determination ◽

Electron Crystallography

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Z-Contrast Imaging in the Scanning Transmission Electron Microscope

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_3 ◽

2001 ◽

pp. 81-111 ◽

Cited By ~ 3

Author(s):

Stephen J. Pennycook ◽

Yanfa Yan

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Contrast Imaging ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Z Contrast

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The Modern Microscope Today

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_1 ◽

2001 ◽

pp. 1-34

Author(s):

Michael M. Kersker

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Point Group and Space Group Identification by Convergent Beam Electron Diffraction

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_9 ◽

2001 ◽

pp. 273-299

Author(s):

Yi Liu

Keyword(s):

Electron Diffraction ◽

Group Identification ◽

Point Group ◽

Convergent Beam Electron Diffraction ◽

Beam Electron ◽

Space Group ◽

Convergent Beam

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Advanced Techniques in TEM Specimen Preparation

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences ◽

10.1007/978-3-662-09518-8_10 ◽

2001 ◽

pp. 301-361 ◽

Cited By ~ 7

Author(s):

S. Roberts ◽

J. McCaffrey ◽

L. Giannuzzi ◽

F. Stevie ◽

N. Zaluzec

Keyword(s):

Specimen Preparation

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Progress in Transmission Electron Microscopy 1 - Springer Series in Surface SciencesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

The Quest for Ultra-High Resolution

Weak-Beam Electron Microscopy

Quantitative Analysis of High-Resolution Atomic Images

Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging

Electron Amorphography

Electron Crystallography-Structure Determination by Combining HREM, Crystallographic Image Processing and Electron Diffraction

Z-Contrast Imaging in the Scanning Transmission Electron Microscope

The Modern Microscope Today

Point Group and Space Group Identification by Convergent Beam Electron Diffraction

Advanced Techniques in TEM Specimen Preparation

Progress in Transmission Electron Microscopy 1 - Springer Series in Surface Sciences
Latest Publications