2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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9783981926354
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Common-Centroid Layouts for Analog Circuits: Advantages and Limitations

2021 ◽  
Author(s):  
Arvind K. Sharma ◽  
Meghna Madhusudan ◽  
Steven M. Burns ◽  
Parijat Mukherjee ◽  
Soner Yaldiz ◽  
...  
Keyword(s):  
Analog Circuits

Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits

2021 ◽  
Author(s):  
Sanmitra Banerjee ◽  
Arjun Chaudhuri ◽  
Shao-Chun Hung ◽  
Krishnendu Chakrabarty
Keyword(s):  
Integrated Circuits ◽  
Design For Test

ALIFRouter: A Practical Architecture-Level Inter-FPGA Router for Logic Verification

2021 ◽  
Author(s):  
Zhen Zhuang ◽  
Xing Huang ◽  
Genggeng Liu ◽  
Wenzhong Guo ◽  
Weikang Qian ◽  
...  
Keyword(s):  
Logic Verification

Towards AQFP-Capable Physical Design Automation

2021 ◽  
Author(s):  
Hongjia Li ◽  
Mengshu Sun ◽  
Tianyun Zhang ◽  
Olivia Chen ◽  
Nobuyuki Yoshikawa ◽  
...  
Keyword(s):  
Design Automation ◽  
Physical Design

A Case for Emerging Memories in DNN Accelerators

2021 ◽  
Author(s):  
Avilash Mukherjee ◽  
Kumar Saurav ◽  
Prashant Nair ◽  
Sudip Shekhar ◽  
Mieszko Lis

Printed Stochastic Computing Neural Networks

2021 ◽  
Author(s):  
Dennis D. Weller ◽  
Nathaniel Bleier ◽  
Michael Hefenbrock ◽  
Jasmin Aghassi-Hagmann ◽  
Michael Beigl ◽  
...  
Keyword(s):  
Neural Networks ◽  
Stochastic Computing

Blind Side-Channel SIFA

2021 ◽  
Author(s):  
Melissa Azouaoui ◽  
Kostas Papagiannopoulos ◽  
Dominik Zurner
Keyword(s):  
Side Channel ◽  
Blind Side

Response Time Analysis of Lazy Round Robin

2021 ◽  
Author(s):  
Yue Tang ◽  
Nan Guan ◽  
Zhiwei Feng ◽  
Xu Jiang ◽  
Wang Yi
Keyword(s):  
Response Time ◽  
Round Robin ◽  
Response Time Analysis ◽  
Time Analysis
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