2021 IEEE International Reliability Physics Symposium (IRPS)
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TOTAL DOCUMENTS

143
(FIVE YEARS 143)

H-INDEX

1
(FIVE YEARS 1)

Published By IEEE

9781728168937
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Study on Avalanche Uniformity in 1.2KV GaN Vertical PIN Diode with Bevel Edge-Termination

2021 ◽  
Author(s):  
Ke Zeng ◽  
Srabanti Chowdhury ◽  
Brendan Gunning ◽  
Robert Kaplar ◽  
Travis Anderson
Keyword(s):  
Pin Diode ◽  
Edge Termination ◽  
Bevel Edge

Mechanisms of Contact Formation and Electromigration Reliability in Wirebond Packages

2021 ◽  
Author(s):  
A. T. Osmanson ◽  
M. Tajedini Y.R. Kim ◽  
H. Madanipour ◽  
C. Kim ◽  
B. Glasscock ◽  
...  
Keyword(s):  
Contact Formation

Modeling of HKMG Stack Process Impact on Gate Leakage, SILC and PBTI

2021 ◽  
Author(s):  
Dimple Kochar ◽  
Tarun Samadder ◽  
Subhadeep Mukhopadhyay ◽  
Souvik Mahapatra
Keyword(s):  
Gate Leakage

Strategy to Characterize Electromigration Short Length Effects in Cu/low-k Interconnects

2021 ◽  
Author(s):  
Z. Zhang ◽  
M. Kraatz ◽  
M. Hauschildt ◽  
S. Choi ◽  
A. Clausner ◽  
...  
Keyword(s):  
Short Length ◽  
Low K ◽  
Length Effects

BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations

2021 ◽  
Author(s):  
L. Gerrer ◽  
J. Cluzel ◽  
F. Gaillard ◽  
X. Garros ◽  
X. Federspiel ◽  
...  
Keyword(s):  
Machine Learning ◽  
Stress Patterns
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