2015 Symposium on VLSI Circuits (VLSI Circuits)
Latest Publications

TOTAL DOCUMENTS

152

(FIVE YEARS 0)

H-INDEX

12

(FIVE YEARS 0)

Published By IEEE

9784863485020

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A 2.8mW/Gb/s 14Gb/s serial link transceiver in 65nm CMOS

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231320 ◽

2015 ◽

Cited By ~ 1

Author(s):

Saurabh Saxena ◽

Guanghua Shu ◽

Romesh Kumar Nandwana ◽

Mrunmay Talegaonkar ◽

Ahmed Elkholy ◽

...

Keyword(s):

Serial Link ◽

Serial Link Transceiver

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2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231241 ◽

2015 ◽

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A 16nm FinFet 19/39MHz 78/72dB DR noise-injected aggregated CTSDM ADC for configurable LTE advanced CCA/NCCA Application

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231280 ◽

2015 ◽

Cited By ~ 3

Author(s):

Tsung-Kai Kao ◽

Ping Chen ◽

Jui-Yuan Tsai ◽

Pao-Cheng Chiu

Keyword(s):

Lte Advanced

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Profiting from IoT: The key is very-large-scale happiness integration

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231287 ◽

2015 ◽

Cited By ~ 2

Author(s):

Kazuo Yano ◽

Tomoaki Akitomi ◽

Koji Ara ◽

Junichiro Watanabe ◽

Satomi Tsuji ◽

...

Keyword(s):

Large Scale

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IoT: The Impact of Things

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231361 ◽

2015 ◽

Cited By ~ 1

Author(s):

Jo de Boeck

Keyword(s):

The Impact

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Circuits evening panel discussion 2: Wearable electronics: Still an oasis or just a mirage for the semiconductor industry?

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231358 ◽

2015 ◽

Author(s):

Y.-S. Shu ◽

N. Verma ◽

N. Verma ◽

K. Yano ◽

T. Someya ◽

...

Keyword(s):

Semiconductor Industry ◽

Panel Discussion ◽

Wearable Electronics

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Enabling closed-loop neural interface: A bi-directional interface circuit with stimulation artifact cancellation and cross-channel CM noise suppression

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231342 ◽

2015 ◽

Cited By ~ 6

Author(s):

Adam E. Mendrela ◽

Jihyun Cho ◽

Jeffrey A. Fredenburg ◽

Cynthia A. Chestek ◽

Michael P. Flynn ◽

...

Keyword(s):

Closed Loop ◽

Noise Suppression ◽

Neural Interface ◽

Interface Circuit

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Design and demonstration of reliability-aware Ge gate stacks with 0.5 nm EOT

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231383 ◽

2015 ◽

Cited By ~ 1

Author(s):

C. Lu ◽

C. H. Lee ◽

T. Nishimura ◽

A. Toriumi

Keyword(s):

Gate Stacks

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Reliability enhancement of 1Xnm TLC for cold flash and millennium memories

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231369 ◽

2015 ◽

Cited By ~ 1

Author(s):

Senju Yamazaki ◽

Shuhei Tanakamaru ◽

Sakuya Suzuki ◽

Tomoko Ogura Iwasaki ◽

Shogo Hachiya ◽

...

Keyword(s):

Reliability Enhancement

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A 3.8 mW/Gbps quad-channel 8.5–13 Gbps serial link with a 5-tap DFE and a 4-tap transmit FFE in 28 nm CMOS

2015 Symposium on VLSI Circuits (VLSI Circuits) ◽

10.1109/vlsic.2015.7231318 ◽

2015 ◽

Author(s):

Tamer Ali ◽

Lakshmi Rao ◽

Ullas Singh ◽

Mohammed Abdul-Latif ◽

Yang Liu ◽

...

Keyword(s):

Serial Link ◽

28 Nm

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