84th ARFTG Microwave Measurement Conference
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25

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5

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Published By IEEE

9781479970858

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Session A: Remote sensing and noise measurements

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013401 ◽

2014 ◽

Keyword(s):

Remote Sensing ◽

Noise Measurements

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Measurement uncertainty in waveguide VNA calibrated by offset short calibration with oversized waveguide aperture at sub-millimeter wave frequency

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013420 ◽

2014 ◽

Cited By ~ 1

Author(s):

Masahiro Horibe ◽

Ryoko Kishikawa

Keyword(s):

Measurement Uncertainty ◽

Millimeter Wave ◽

Wave Frequency ◽

Oversized Waveguide

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Residual error analysis of a calibrated vector network analyzer

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013417 ◽

2014 ◽

Cited By ~ 2

Author(s):

Faisal Mubarak ◽

Gert Rietveld

Keyword(s):

Error Analysis ◽

Vector Network Analyzer ◽

Residual Error ◽

Network Analyzer

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On-wafer differential noise figure measurement without couplers on a vector network analyzer

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013403 ◽

2014 ◽

Cited By ~ 1

Author(s):

Yogadissen Andee ◽

Alexandre Siligaris ◽

Francois Graux ◽

Frangois Danneville

Keyword(s):

Noise Figure ◽

Vector Network Analyzer ◽

Network Analyzer

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A calibration procedure for electronic calibration units

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013414 ◽

2014 ◽

Cited By ~ 3

Author(s):

J. Stenarson ◽

C. Eio ◽

K. Yhland

Keyword(s):

Calibration Procedure

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Two port calibration insensitive to flange misalignment

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013416 ◽

2014 ◽

Author(s):

Alexander Arsenovic ◽

Robert M. Weikle ◽

Jeffrey Hesler

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Accuracy and repeatability of automated non-contact probes for on-wafer characterization

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013406 ◽

2014 ◽

Cited By ~ 2

Author(s):

Cosan Caglayan ◽

Georgios C. Trichopoulos ◽

Kubilay Sertel

Keyword(s):

Accuracy And Repeatability

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Comparison of noise-parameter measurement strategies: Simulation results for amplifiers

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013402 ◽

2014 ◽

Cited By ~ 1

Author(s):

James Randa

Keyword(s):

Parameter Measurement ◽

Noise Parameter ◽

Simulation Results ◽

Measurement Strategies

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Adaptive estimation of complex calibration residual errors of wafer-level S-parameters measurement system

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013410 ◽

2014 ◽

Cited By ~ 9

Author(s):

Aleksandr A. Savin ◽

Vladimir G. Guba ◽

Andrej Rumiantsev ◽

Benjamin D. Maxson ◽

Dirk Schubert ◽

...

Keyword(s):

Measurement System ◽

Adaptive Estimation ◽

Wafer Level ◽

S Parameters ◽

Parameters Measurement ◽

Residual Errors

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A near-field scanning microwave microscope for measurement of the permittivity and loss of high-loss materials

84th ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2014.7013419 ◽

2014 ◽

Cited By ~ 7

Author(s):

A P Gregory ◽

J F Blackburn ◽

K Lees ◽

R N Clarke ◽

T E Hodgetts ◽

...

Keyword(s):

Near Field ◽

High Loss ◽

Microwave Microscope ◽

Near Field Scanning

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