2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
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9781509039692

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Novel memory hierarchy with e-STT-MRAM for near-future applications

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939700 ◽

2017 ◽

Cited By ~ 2

Author(s):

Shinobu Fujita ◽

Hiroki Noguchi ◽

Kazutaka Ikegami ◽

Susumu Takeda ◽

Kumiko Nomura ◽

...

Keyword(s):

Memory Hierarchy ◽

Near Future

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Optimization for application-specific packet-based on-chip interconnects using a cycle-accurate model

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939676 ◽

2017 ◽

Author(s):

Yu-Ju Shih ◽

Chih-Tsun Huang ◽

Jing-Jia Liou ◽

Jyu-Yuan Lai ◽

Chih-Wea Wang ◽

...

Keyword(s):

Accurate Model ◽

On Chip ◽

Application Specific

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Reducing aging on scratchpad memory using temporal- and FSM-based power management

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939675 ◽

2017 ◽

Author(s):

Yun Kae Law ◽

Ing-Chao Lin ◽

Cheng-Chien Lin

Keyword(s):

Power Management ◽

Scratchpad Memory

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A 6.4G LLR/s 8×8 64-QAM soft-output MIMO detector with lattice reduction preprocessing

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939685 ◽

2017 ◽

Author(s):

Jing-You Lin ◽

Jung-Chun Chi ◽

Chun-Fu Liao ◽

Yuan-Hao Huang

Keyword(s):

Lattice Reduction

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Thermal sensor allocation and full-system temperature characterization for thermal-aware mesh-based NoC system by using compressive sensing technique

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939679 ◽

2017 ◽

Cited By ~ 1

Author(s):

Kun-Chih Chen ◽

Yu-Hsien Chen ◽

Yen-Po Lin

Keyword(s):

Compressive Sensing ◽

Thermal Sensor ◽

Full System ◽

System Temperature

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Automotive semiconductor test

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939655 ◽

2017 ◽

Cited By ~ 2

Author(s):

Steve Pateras ◽

Ting-Pu Tai

Keyword(s):

Semiconductor Test

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Conventional and neuromorphic systems leveraging emerging memory technologies

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939673 ◽

2017 ◽

Author(s):

Hai Li

Keyword(s):

Neuromorphic Systems ◽

Emerging Memory

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Virtual Reality: The new era of the future world

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939707 ◽

2017 ◽

Author(s):

Raymond Pao

Keyword(s):

Virtual Reality ◽

New Era ◽

The Future

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High-level Fault Diagnosis on network-on-chip using path tracking

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939650 ◽

2017 ◽

Author(s):

Minhui Ke ◽

Ying Zhang ◽

Jianhui Jiang

Keyword(s):

Fault Diagnosis ◽

Network On Chip ◽

Path Tracking ◽

On Chip ◽

High Level

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ITRI mmWave radio access technology development

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2017.7939652 ◽

2017 ◽

Cited By ~ 1

Author(s):

Wen Chiang Chen

Keyword(s):

Technology Development ◽

Access Technology ◽

Radio Access Technology ◽

Radio Access

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2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Novel memory hierarchy with e-STT-MRAM for near-future applications

Optimization for application-specific packet-based on-chip interconnects using a cycle-accurate model

Reducing aging on scratchpad memory using temporal- and FSM-based power management

A 6.4G LLR/s 8×8 64-QAM soft-output MIMO detector with lattice reduction preprocessing

Thermal sensor allocation and full-system temperature characterization for thermal-aware mesh-based NoC system by using compressive sensing technique

Automotive semiconductor test

Conventional and neuromorphic systems leveraging emerging memory technologies

Virtual Reality: The new era of the future world

High-level Fault Diagnosis on network-on-chip using path tracking

ITRI mmWave radio access technology development

2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
Latest Publications