2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
Latest Publications

TOTAL DOCUMENTS

104

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

0780385284

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Leakage-induced signal degradation in VLSI interconnection for buffered bus line & logic

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309892 ◽

2005 ◽

Author(s):

P. Aum

Keyword(s):

Signal Degradation ◽

Induced Signal

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Low-K cu damascene interconnection leakage and process induced damage assessment

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309966 ◽

2005 ◽

Author(s):

P. Aum

Keyword(s):

Damage Assessment ◽

Low K

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The Double-Gate FinFET: Device and Impact on IC Design Automation

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309929 ◽

2005 ◽

Author(s):

I. Aller ◽

J.G. Clabes

Keyword(s):

Design Automation ◽

Double Gate ◽

Ic Design

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Welcome from the ICICDT Conference Chair

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309884 ◽

2005 ◽

Author(s):

Thuy Dao

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Build-in reliability analysis for circuit design in the nanometer technology era

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309946 ◽

2004 ◽

Cited By ~ 1

Author(s):

Zhihong Liu ◽

Weiquan Zhang ◽

Fuchen Mu

Keyword(s):

Reliability Analysis ◽

Circuit Design ◽

Nanometer Technology

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Breakdown transients in ultra-thin gate oxynitrides

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309982 ◽

2004 ◽

Cited By ~ 1

Author(s):

S. Lombardo ◽

F. Palumbo ◽

J.H. Stathis ◽

B.P. Linder ◽

K.L. Pey ◽

...

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Fast/sub 14/ Technology: design technology for the automation of multi-gigahertz digital logic

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309937 ◽

2004 ◽

Cited By ~ 1

Author(s):

S. Horne ◽

D. Glowka ◽

S. McMahon ◽

P. Nixon ◽

M. Seningen ◽

...

Keyword(s):

Digital Logic ◽

Technology Design ◽

Design Technology

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Atmospheric neutron effects in advanced microelectronics, standards and applications

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309974 ◽

2004 ◽

Cited By ~ 5

Author(s):

J.-L. Leray ◽

J. Baggio ◽

V. Ferlet-Cavrois ◽

O. Flament

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An embedded silicon nanocrystal nonvolatile memory for the 90nm technology node operating at 6V

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309900 ◽

2004 ◽

Cited By ~ 1

Author(s):

R. Muralidhar ◽

R.F. Steimle ◽

M. Sadd ◽

R. Rao ◽

C.T. Swift ◽

...

Keyword(s):

Nonvolatile Memory ◽

Silicon Nanocrystal ◽

Technology Node

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Statistical design for variation tolerance: key to continued Moore's law

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) ◽

10.1109/icicdt.2004.1309939 ◽

2004 ◽

Cited By ~ 7

Author(s):

T. Karnik ◽

V. De ◽

S. Borkar

Keyword(s):

Statistical Design ◽

Moore’S Law ◽

Moore's Law ◽

Variation Tolerance

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2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Leakage-induced signal degradation in VLSI interconnection for buffered bus line & logic

Low-K cu damascene interconnection leakage and process induced damage assessment

The Double-Gate FinFET: Device and Impact on IC Design Automation

Welcome from the ICICDT Conference Chair

Build-in reliability analysis for circuit design in the nanometer technology era

Breakdown transients in ultra-thin gate oxynitrides

Fast/sub 14/ Technology: design technology for the automation of multi-gigahertz digital logic

Atmospheric neutron effects in advanced microelectronics, standards and applications

An embedded silicon nanocrystal nonvolatile memory for the 90nm technology node operating at 6V

Statistical design for variation tolerance: key to continued Moore's law

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
Latest Publications