2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
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Window effects in HBM and TLP testing

2017 ◽  
Author(s):  
Theo Smedes ◽  
Wolfgang Scheucher ◽  
Dolphin Abessolo-Bidzo
Keyword(s):  
Window Effects

Qualification challenges of footwear and flooring systems

2017 ◽  
Author(s):  
Toni Viheriakoski ◽  
Vesa Jokinen ◽  
Jeremy Smallwood ◽  
Ari Korpipaa ◽  
Pasi Tamminen

Correlation study of different CDM testers and CC-TLP

2017 ◽  
Author(s):  
Johannes Weber ◽  
Karim T. Kaschani ◽  
Horst Gieser ◽  
Heinrich Wolf ◽  
Linus Maurer ◽  
...  
Keyword(s):  
Correlation Study

High blocking voltage ESD timer clamp with mis-trigger protection

2017 ◽  
Author(s):  
Sirui Luo ◽  
Srivatsan Parthasarathy ◽  
Javier A. Salcedo ◽  
Jean-Jacques Hajjar
Keyword(s):  
Blocking Voltage

On the ESD behavior of AlGaN/GaN schottky diodes and trap assisted failure mechanism

2017 ◽  
Author(s):  
Bhawani Shankar ◽  
Rudrarup Sengupta ◽  
Sayak Dutta Gupta ◽  
Ankit Soni ◽  
Nagaboopathy Mohan ◽  
...  
Keyword(s):  
Failure Mechanism ◽  
Schottky Diodes
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