RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3)
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0780317939

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Single and multiple proton-induced NIEL events in silicon

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316523 ◽

2002 ◽

Cited By ~ 3

Author(s):

L. Chen ◽

P.J. McNulty ◽

W.G. Abdel-Kader ◽

T.L. Miller ◽

D.A. Thompson

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Evaluation of fast-neutron radiation effects in optical fibers for fusion reactor diagnostics

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316533 ◽

2002 ◽

Author(s):

D.L. Griscom ◽

M.E. Gingerich ◽

E.J. Friebele ◽

M.A. Putnam ◽

W. Unruh

Keyword(s):

Fast Neutron ◽

Optical Fibers ◽

Radiation Effects ◽

Fusion Reactor ◽

Neutron Radiation ◽

Neutron Radiation Effects

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Radiation induced lifetime degradation in SIMOX structures

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316572 ◽

2002 ◽

Author(s):

S. Cristoloveanu ◽

A.M. Ionescu ◽

A. Chovet ◽

E.H.M. Heijne ◽

P. Jarron

Keyword(s):

Radiation Induced

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A 256 K static random-access memory implemented in silicon-on-insulator technology

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316571 ◽

2002 ◽

Author(s):

N. van Vonno ◽

B.R. Doyle

Keyword(s):

Random Access ◽

Random Access Memory ◽

Silicon On Insulator ◽

Static Random Access Memory ◽

Access Memory ◽

Silicon On Insulator Technology

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Heavy ion sensitivity of a SRAM in SOI bulk-like technology

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316518 ◽

2002 ◽

Cited By ~ 3

Author(s):

V. Ferlet-Cavrois ◽

O. Musseau ◽

J.L. Leray ◽

Y.M. Coic ◽

J.L. Pelloie

Keyword(s):

Heavy Ion

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Rad-hard embedded computers for nuclear robotics

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316553 ◽

2002 ◽

Author(s):

A. Giraud ◽

F. Joffre ◽

M. Marceau ◽

M. Robiolle ◽

J.P. Brunet ◽

...

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Electron transport and impact ionization in SiO/sub 2/

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316542 ◽

2002 ◽

Author(s):

J.N. Bradford ◽

S. Woolf

Keyword(s):

Electron Transport ◽

Impact Ionization

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Tactical army dosimeter based on P-MOS single and dual gate insulators

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316551 ◽

2002 ◽

Cited By ~ 2

Author(s):

G.J. Brucker ◽

S. Kronenberg ◽

T. Jordan

Keyword(s):

Gate Insulators ◽

Dual Gate

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Protons and heavy ions induced stuck bits on large capacity RAMs

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316527 ◽

2002 ◽

Cited By ~ 10

Author(s):

S. Duzellier ◽

D. Falguere ◽

R. Ecoffet

Keyword(s):

Heavy Ions ◽

Large Capacity

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Investigation of single event effects at the system level

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) ◽

10.1109/radecs.1993.316544 ◽

2002 ◽

Cited By ~ 2

Author(s):

D.M. Newberry

Keyword(s):

System Level ◽

Single Event ◽

Single Event Effects

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RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Single and multiple proton-induced NIEL events in silicon

Evaluation of fast-neutron radiation effects in optical fibers for fusion reactor diagnostics

Radiation induced lifetime degradation in SIMOX structures

A 256 K static random-access memory implemented in silicon-on-insulator technology

Heavy ion sensitivity of a SRAM in SOI bulk-like technology

Rad-hard embedded computers for nuclear robotics

Electron transport and impact ionization in SiO/sub 2/

Tactical army dosimeter based on P-MOS single and dual gate insulators

Protons and heavy ions induced stuck bits on large capacity RAMs

Investigation of single event effects at the system level

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3)
Latest Publications