ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)

Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.1193989 ◽

2005 ◽

Cited By ~ 1

Author(s):

R. Gillon ◽

W. Van De Sype ◽

D. Vanhoenaker ◽

L. Martens

Keyword(s):

High Frequency ◽

In Situ Calibration

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High-spatial-frequency MOS transistor gate length variations in SRAM circuits

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844400 ◽

2002 ◽

Cited By ~ 2

Author(s):

X. Ouyang ◽

T. Deeter ◽

C.N. Berglund ◽

R.F.W. Pease ◽

M.A. McCord

Keyword(s):

Spatial Frequency ◽

High Spatial Frequency ◽

Gate Length ◽

Mos Transistor

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Gate-length dependence of bulk generation lifetime and surface generation velocity measurement in high-resistivity silicon using gated diodes

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844410 ◽

2002 ◽

Cited By ~ 1

Author(s):

G.-F. Dalla Betta ◽

G. Verzellesi ◽

T. Boscardin ◽

G.U. Pignatel ◽

L. Bosisio ◽

...

Keyword(s):

Velocity Measurement ◽

Surface Generation ◽

High Resistivity ◽

Gate Length ◽

Length Dependence ◽

Surface Generation Velocity ◽

Generation Lifetime ◽

High Resistivity Silicon

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Characterization of electrical linewidth test structures patterned in [100] silicon-on-insulator for use as CD standards

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844393 ◽

2002 ◽

Cited By ~ 1

Author(s):

M.W. Cresswell ◽

R.A. Allen ◽

R.N. Ghoshtagore ◽

N.M.P. Guillaume ◽

P.J. Shea ◽

...

Keyword(s):

Silicon On Insulator

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Physically-based effective width modeling of MOSFETs and diffused resistors

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844426 ◽

2002 ◽

Cited By ~ 5

Author(s):

C.C. McAndrew ◽

S. Sekine ◽

A. Cassagnes ◽

Zhicheng Wu

Keyword(s):

Effective Width ◽

Physically Based

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Rapid evaluation of the root causes of BJT mismatch

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844418 ◽

2002 ◽

Cited By ~ 7

Author(s):

P.G. Drennan ◽

C.C. McAndrew ◽

J. Bates ◽

D. Schroder

Keyword(s):

Rapid Evaluation

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Characterization and modeling of LDMOS transistors on a 0.6 μm CMOS technology

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844427 ◽

2002 ◽

Cited By ~ 2

Author(s):

E.C. Griffith ◽

J.A. Power ◽

S.C. Kelly ◽

P. Elebert ◽

S. Whiston ◽

...

Keyword(s):

Cmos Technology

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Characterisation of systematic MOSFET transconductance mismatch

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844419 ◽

2002 ◽

Cited By ~ 6

Author(s):

H. Tuinhout

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Reliability evaluation method of low temperature poly-silicon TFTs using dynamic stress

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844424 ◽

2002 ◽

Cited By ~ 2

Author(s):

Y. Uraoka ◽

T. Hatayama ◽

T. Fuyuki

Keyword(s):

Low Temperature ◽

Evaluation Method ◽

Dynamic Stress ◽

Reliability Evaluation ◽

Poly Silicon

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A novel approach for precise characterization of long distance mismatch of CMOS-devices

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ◽

10.1109/icmts.2000.844422 ◽

2002 ◽

Cited By ~ 4

Author(s):

U. Schaper ◽

C. Linnenbank ◽

R. Thewes

Keyword(s):

Long Distance ◽

Novel Approach ◽

Precise Characterization

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ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration

High-spatial-frequency MOS transistor gate length variations in SRAM circuits

Gate-length dependence of bulk generation lifetime and surface generation velocity measurement in high-resistivity silicon using gated diodes

Characterization of electrical linewidth test structures patterned in [100] silicon-on-insulator for use as CD standards

Physically-based effective width modeling of MOSFETs and diffused resistors

Rapid evaluation of the root causes of BJT mismatch

Characterization and modeling of LDMOS transistors on a 0.6 μm CMOS technology

Characterisation of systematic MOSFET transconductance mismatch

Reliability evaluation method of low temperature poly-silicon TFTs using dynamic stress

A novel approach for precise characterization of long distance mismatch of CMOS-devices

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ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration

High-spatial-frequency MOS transistor gate length variations in SRAM circuits

Gate-length dependence of bulk generation lifetime and surface generation velocity measurement in high-resistivity silicon using gated diodes

Characterization of electrical linewidth test structures patterned in [100] silicon-on-insulator for use as CD standards

Physically-based effective width modeling of MOSFETs and diffused resistors

Rapid evaluation of the root causes of BJT mismatch

Characterization and modeling of LDMOS transistors on a 0.6 μm CMOS technology

Characterisation of systematic MOSFET transconductance mismatch

Reliability evaluation method of low temperature poly-silicon TFTs using dynamic stress

A novel approach for precise characterization of long distance mismatch of CMOS-devices

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)
Latest Publications