2010 76th ARFTG Microwave Measurement Conference
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9781424474479

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Calculation of maximal applicable gain for the generalized and the direct method for extreme impedances measurement

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700060 ◽

2010 ◽

Cited By ~ 1

Author(s):

Martin Randus ◽

Karel Hoffmann

Keyword(s):

Direct Method

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Characterization and verification of coaxial open-circuit primary standards for millimeter-wave vector network analyzer calibration

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700050 ◽

2010 ◽

Cited By ~ 2

Author(s):

Masahiro Horibe ◽

Nick Ridler ◽

Martin Salter ◽

Christopher Eio

Keyword(s):

Millimeter Wave ◽

Wave Vector ◽

Open Circuit ◽

Vector Network Analyzer ◽

Network Analyzer ◽

Primary Standards

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Rectangular-waveguide vector-network-analyzer calibrations with imperfect test ports

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700048 ◽

2010 ◽

Cited By ~ 4

Author(s):

Dylan F. Williams

Keyword(s):

Rectangular Waveguide ◽

Vector Network Analyzer ◽

Network Analyzer ◽

Imperfect Test

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Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700046 ◽

2010 ◽

Cited By ~ 12

Author(s):

Nick Ridler ◽

Roland Clarke ◽

Martin Salter ◽

Alan Wilson

Keyword(s):

National Standards ◽

S Parameter

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2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700068 ◽

2010 ◽

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Broadband measurements of nanofiber devices: Repeatability and random error analysis

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700058 ◽

2010 ◽

Cited By ~ 1

Author(s):

T. Mitch Wallis ◽

Atif Imtiaz ◽

Sang-Hyun Lim ◽

Pavel Kabos ◽

Kichul Kim ◽

...

Keyword(s):

Error Analysis ◽

Random Error

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76th ARFTG conference organizers

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700069 ◽

2010 ◽

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Through-wafer via modeling based on direct RF characterization

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700045 ◽

2010 ◽

Author(s):

M. D. Brunsman

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Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700051 ◽

2010 ◽

Cited By ~ 1

Author(s):

Pooyan Sakian ◽

Erwin Janssen ◽

Jaap Essing ◽

Reza Mahmoudi ◽

Arthur van Roermund

Keyword(s):

Noise Figure ◽

Parameter Measurement ◽

S Parameter

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Calibration accuracy of a 625 GHz on-wafer probe

2010 76th ARFTG Microwave Measurement Conference ◽

10.1109/arftg76.2010.5700054 ◽

2010 ◽

Cited By ~ 7

Author(s):

Theodore J. Reck ◽

Lihan Chen ◽

Chunhu Zhang ◽

Alex Arsenovic ◽

Arthur Lichtenberger ◽

...

Keyword(s):

Calibration Accuracy

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2010 76th ARFTG Microwave Measurement Conference
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Calculation of maximal applicable gain for the generalized and the direct method for extreme impedances measurement

Characterization and verification of coaxial open-circuit primary standards for millimeter-wave vector network analyzer calibration

Rectangular-waveguide vector-network-analyzer calibrations with imperfect test ports

Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

Table of contents

Broadband measurements of nanofiber devices: Repeatability and random error analysis

76th ARFTG conference organizers

Through-wafer via modeling based on direct RF characterization

Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

Calibration accuracy of a 625 GHz on-wafer probe

Export Citation Format

2010 76th ARFTG Microwave Measurement ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Calculation of maximal applicable gain for the generalized and the direct method for extreme impedances measurement

Characterization and verification of coaxial open-circuit primary standards for millimeter-wave vector network analyzer calibration

Rectangular-waveguide vector-network-analyzer calibrations with imperfect test ports

Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

Table of contents

Broadband measurements of nanofiber devices: Repeatability and random error analysis

76th ARFTG conference organizers

Through-wafer via modeling based on direct RF characterization

Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits

Calibration accuracy of a 625 GHz on-wafer probe

2010 76th ARFTG Microwave Measurement Conference
Latest Publications