Interface State Density Evaluation of p-Type and n-Type Ge/GeNxStructures by Conductance Technique
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2013 ◽
Vol 133
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pp. 1279-1284
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1992 ◽
Vol 63
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pp. 4189-4191
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2000 ◽
Vol 44
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pp. 1511-1514
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Vol 34
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pp. 052002
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Vol 600-603
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Vol 8
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pp. 035016
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