On Phase Transitions Stimulated in Amorphized Silicon by Nanosecond Pulsed Laser Annealing

1987 ◽  
Vol 103 (2) ◽  
pp. K87-K91 ◽  
Author(s):  
G. D. Ivlev ◽  
V. L. Malevich
Physica B+C ◽  
1983 ◽  
Vol 117-118 ◽  
pp. 1024-1026 ◽  
Author(s):  
Kouichi Murakami ◽  
Hisayoshi Itoh ◽  
Kōki Takita ◽  
Kohzoh Masuda

1986 ◽  
Vol 71 ◽  
Author(s):  
O. Bostanjoglo ◽  
F. E. Endruschat ◽  
W. Tornow

AbstractThis paper presents an improved new method for studying the dynamics of laser induced phase transitions down to the submicron-nanosecond scale by means of a modified commercial Transmission Electron Microscope (TEM) /1/. Results on Pulsed Laser Annealing (PLA) of amorphous Germanium and a-Si/Al films are described. Potential applications and limits of this method are briefly discussed.


2019 ◽  
Vol 21 (13) ◽  
pp. 7208-7219 ◽  
Author(s):  
Anagh Bhaumik ◽  
Jagdish Narayan

The formation of DNFs utilizing a low-temperature budget route will revolutionize their use in electronic, biomedical, and photonic devices.


2016 ◽  
Vol 247 ◽  
pp. 24-29 ◽  
Author(s):  
Herman A. Novikov ◽  
Rustem M. Bayazitov ◽  
Rafael M. Batalov ◽  
Ildar A. Faizrakhmanov ◽  
Gennadii D. Ivlev ◽  
...  

Ion-beam deposition of amorphous Ge layers on different substrates (silicon and quartz) has been performed. Deposited amorphous Ge layers were subjected to pulsed laser annealing (λ = 0.69 μm, τ = 80 ns). Simultaneously the optical probing of the Ge surface was carried out. The computer simulation of heating processes and phase transitions was performed taking into account the temperature dependences of film and substrates’ parameters and phase transition energies. The results of the dynamics of heating, melting, crystallization and plasma formation processes are well described by simulation data. It is shown that the threshold values for radiation power density and phase transition rates are determined mainly by thermophysical parameters of the substrates and thermal contact between Ge melt and substrate.


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